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Financial investments are subsidised within the “Ziel-2-Programm Rheinland-Pfalz” by the EU and the State of Rhineland-Palatinate

en:auftragsforschung:ausstattung

Equipment

  • Electron Spectroscopy
    • Auger Electron Spectroscopy (AES)
    • X-ray Photoelectron Spectroscopy (XPS, ESCA)
    • Ultraviolet Photoelectron Spectroscopy (UPS)
  • Surface Mass Spectrometry
    • dynamic secundary Ion Mass Spectrometry (dynamic SIMS)
    • Time-of-Flight Mass Spectrometry (ToF-SIMS)
    • Secundary Neutral Mass Spectrometry (SNMS)
    • 3D Atom Probe Tomography (3D-APT)
  • Microscale Analytics
    • Scanning Electron Microscopy (SEM) with
      • Energy-dispersive X-ray Analysis (EDX)
      • Wavelength-dispersive X-ray Analysis (WDX)
      • Electron Backscatter Diffraction (EBSD)
    • Focused Ion Beam in combination with Scanning Electron Microscopy (Dual-Beam-FIB)
  • Nanoscale Analytics
    • Transmission Electron Microscopy (TEM) with
      • Energy-dispersive X-ray Analysis (EDX)
      • Electron Energy Loss Spectroscopy (EELS)
      • Selected Area Electron Diffraction (TED, SAD)
      • Automated Crystal Orientation Mapping (ACOM)
      • TEM preparation (Ultramicrotomy, Ion Thinning, FIB, …)
    • Scanning Force Microskopy (SFM, AFM)
    • Micro- and Nanoindentation
    • Nanoscratching
  • X-ray Analysis
    • X-ray Diffractometry (XRD)
    • X-ray Reflectometry (XRR)
  • more …
    • Tribometry
    • Fourier Transform Infrared Spectroscopy (FTIR)
    • Raman Spectroscopy
    • UV/Vis Spectroscopy
    • White-light Interferometry (WLI)
    • Contact Angle Analysis
    • Metallography
    • Light Microscopy

en/auftragsforschung/ausstattung.txt · Last modified: 2017/09/28 12:32 by reuscher@ifos.uni-kl.de

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