Surface-Inspection-Pad (SIP) – Ein neuartiger Ansatz für die ressourcenschonende Probennahme zur Kontaminationskontrolle von Bauteiloberflächen
M. Wahl, W. Bock, M. Kopnarski
Vakuum in Forschung und Praxis 35 (2023) 26-32; https://doi.org/10.1002/vipr.202300808

A perfluoralkyl/rose bengal functionalized Janus material for photocatalytic transformations with singlet oxygen
O. Pourshiani, Z. Romero, N. Ganji, T. Herrendorf, A. Seifert, A. Demchenko, M.H. Prosenc, W. Kleist, M. Kopnarski, B. Karimi, W.R. Thiel
Journal of Materials Chemistry A, eingereicht zur Veröffentlichung

Influence of PTFE-based dry lubricants on friction and wear behavior in dry lubricated steel-bronze contact
L.S. Kamga, S. Emrich, R. Merz, M. Oehler, M. Gedan-Smolka, M. Kopnarski, S. Sauer
ASME Journal of Tribology 145 (2023) 121703-1; https://doi.org/10.1115/1.4063116

Enhanced protein immobilization efficacy by nanostructuring of ultrananocrystalline diamond surface
D. Merker, D. Bertinetti, R. Merz, M. Kopnarski, F.W. Herberg, C. Popov
Diamond & Related Materials 136 (2023) 109898; https://doi.org/10.1016/j.diamond.2023.109898

Multiple scratching: An atomistic study
I.A. Alhafez, M. Kopnarski, H.M. Urbassek
Tribology Letters (2023) 71:46; https://doi.org/10.1007/s11249-023-01718-3

Multiple regression analysis of the chemical components effect on wettability at ps laser micro-structured surfaces on stainless steel 304
M. Chijiiwa, N. Berger, M. Schäfer, R. Merz (SFB 926/B08), M. Kopnarski (SFB 926/B08), P. Mitschang, J.A. L’huillier
Applied Surface Science 607 (2023) 154852; https://doi.org/10.1016/j.apsusc.2022.154852

On the generation of MCs⁺ ions in SIMS with Cs⁺ primary beams
H. Oechsner
Surface and Interface Analysis 54 (2022) 657-660; https://doi.org/10.1002/sia.7077

Janus bifunctional periodic mesoporous organosilica
M. Vafaeezadeh, K. Weber, A. Demchenko, P. Lösch, P. Breuninger, A. Lösch, M. Kopnarski, S. Antonyuk, W. Kleist, W.R. Thiel
Chemical Communications 58 (2022) 112-115; https://doi.org/10.1039/D1CC06086D

An in-depth evaluation of sample and measurement induced influences on static contact angle measurement
S.M. Lößlein, R. Merz, D.W. Müller, M. Kopnarski, F. Mücklich
Scientific Reports 12/19389  (2022) 1-16; https://doi.org/10.1038/s41598-022-23341-3

The effect of irradiated PTFE on the friction and wear behavior of chemically bonded PA46-PTFE-cb and PA66-PTFE-cb compounds
L.S. Kamga, T.-D. Nguyen, S. Emrich, M. Oehler, T. Schmidt, M. Gedan-Smolka, M. Kopnarski, B. Sauer
Wear 502-503 (2022) 204380; https://doi.org/10.1016/j.wear.2022.204380

Experimentelle Untersuchungen an feststoffgeschmierten Wälzlagern im Hochvakuum
M. Werner, S. Emrich, B. Sauer, M. Kopnarski, S. Thielen
Forschung im Ingenieurwesen 85 (2021) 1077-1090; https://doi.org/10.1007/s10010-021-00558-8

Lubrication performance of a polyetheretherketone (PEEK) and polytetrafluoroethylene (PTFE) blend within a steel/steel tribosystem
L. Lin, S. Emrich, M. Kopnarski, A.K. Schlarb
Wear 484-485 (2021) 203997; https://doi.org/10.1016/j.wear.2021.203997

Patience is not enough - A guide for the preparation of low-defect sections from pure copper
Geduld allein reicht nicht! - Ein Leitfaden zur Herstellung defektarmer Schliffe von Reinkupfer
S. Lößlein, M. Kasper, C. Pauly, D. Müller, F. Mücklich, R. Merz, M. Kopnarski
Practical Metallography 58(7) (2021) 388-407; https://doi.org/10.1515/pm-2021-0031

Achieving ultra-low friction with diamond/metal systems in extreme environments
P. Stoyanov, R. Merz, M. Stricker, M. Kopnarski, M. Dienwiebel
Materials 14(14) (2021) 3791; https://doi.org/10.3390/ma14143791

The influence of the crystallographic orientation when micro machining commercially pure titanium: A size effect
S. Kieren-Ehses, L. Böhme, L. Morales-Rivas, J. Lösch, B. Kirsch, E. Kerscher, M. Kopnarski, J.C. Aurich
Precision Engineering 72 (2021) 158-171; https://doi.org/10.1016/j.precisioneng.2021.04.007

Determination of the Li distribution in synthetic recycling slag with SIMS
T. Schirmer, M. Wahl, W. Bock, M. Kopnarski
Metals 11 (2021) 825; https://doi.org/10.3390/met11050825

Einfluss einer chemischen Kopplung von strahlenmodifiziertem PTFE mit PA46 auf mechanische Eigenschafen und das Reib- und Verschleißverhalten
L.S. Kamga, T.D. Nguyen, T. Schmidt, M. Gedan-Smolka, S. Emrich, M. Oehler, B. Sauer, M. Kopnarski
Tribologie und Schmierungstechnik 68. Jahrgang, 2 (2021) 28-38; http://dx.doi.org/10.24053/TuS-2021-0011

Chemical bonded PA66-PTFE-oil-composites as novel tribologically effective materials: Part 2
T.D. Nguyen, M. Gedan-Smolka, L.S. Kamga, B. Sauer, S. Emrich, M. Kopnarski, B. Voit
IOP Conference Series: Materials Science and Engineering, 1140 (2021) 012056; http://dx.doi.org/10.1088/1757-899X/1140/1/012056

Chemical bonded oil-PTFE-PA66 composites as novel tribologically effective materials: Part 1
T.-D. Nguyen, M. Gedan-Smolka, L.S. Kamga, B. Sauer, S. Emrich, M. Kopnarski, B. Voit
Solid State Phenomena ISSN: 1662-9779, Vol. 320 (2021) 113-118; https://doi.org/10.4028/www.scientific.net/SSP.320.113

Experimental study of the influence of the adsorbate layer composition on the wetting of different substrates with water
M. Heier, R. Merz, S. Becker, K. Langenbach, M. Kopnarski, H. Hasse
Adsorption Science & Technology (2021) 6663989; https://doi.org/10.1155/2021/6663989

Revealing the interface nature of ZDDP tribofilm by X-ray photoelectron spectroscopy and atom probe tomography
C.-J. Hsu, J. Barrirero, R. Merz, M. Kopnarski, C. Gachot, A. Stratmann, H. Aboulfadl, G. Jacobs, F. Mücklich
Industrial Lubrication and Tribology 72/7 (2020) 923-930; https://doi.org/10.1108/ILT-01-2020-0035

Adsorption and reaction layers when turning AISI 304 using various cooling strategies
S. Basten, B. Kirsch, R. Merz, M. Kopnarski, H. Hasse, J.C. Aurich
Procedia CIRP 87 (2020) 125-130; https://doi.org/10.1016/j.procir.2020.02.1000

Fabrication and characterization of single-crystal diamond membranes for quantum photonics with tunable microcavities
J. Heupel, M. Pallmann, J. Körber, R. Merz, M. Kopnarski, R. Stöhr, J.P. Reithmaier, D. Hunger, C. Popov
Micromachines 11 (2020) 1080; https://doi.org/10.3390/mi11121080

Excessive shaft wear due to radial shaft seals in lubricated environment. Part II: Measures against excessive shaft wear
C. Burkhart, S. Emrich, M. Kopnarski, B. Sauer
Wear 462-463 (2020) 203483; https://doi.org/10.1016/j.wear.2020.203483

Formation of sputter-generated metal nanoclusters: A model study with neutral Cu-trimers
H. Oechsner
Nulear Instruments and Methods in Physics Research B 482 (2020) 6-10; https://doi.org/10.1016/j.nimb.2020.08.0144

Excessive shaft wear due to radial shaft seals in lubricated environment. Part I: Analysis and mechanisms
C. Burkhart, S. Emrich, M. Kopnarski, B. Sauer
Wear 460-461 (2020) 203419; https://doi.org/10.1016/j.wear.2020.2034199

Assessment of the lubrication ability of polymer materials in the fluid-free steel/steel tribosystem
L. Lin, C. Sun, S. Emrich, M. Kopnarski, A.K. Schlarb
Wear 452-453 (2020) 203287; https://doi.org/10.1016/j.wear.2020.203287

Microstructural changes caused by friction loading in high manganese TWIP steel and case-hardened 16MnCr5
A. Brodyanski, M.W. Klein, R. Merz, M. Smaga, T. Beck, M. Kopnarski
Materials Characterization 163 (2020) 110231; https://doi.org/10.1016/j.matchar.2020.110231

Nachbildung und Analyse von Schadensmechanismen bei Dichtringen im tribologischen Ersatzsystem
C. Burkhart, S. Emrich, B. Magyar, M. Kopnarski, B. Sauer
Tribologie und Schmierungstechnik Band. 66, Heft 4-5 (2019) 9-18; https://doi.org/10.30419/TuS-2019-0019

Modification of spintronic terahertz emitter performance through defect engineering
D.M. Nenno, L. Scheuer, D. Sokoluk, S. Keller, G. Torosyan, A. Brodyanski, J. Lösch, M. Battiato, M. Rahm, R.H. Binder, H.C. Schneider, R. Beigang, E.Th. Papaioannou
Scientifc Reports 9, Article number 13348 (2019); https://doi.org/10.1038/s41598-019-49963-8

Influence of tribofilms on failures and friction of gears with particular focus on running-in
A. Ziegltrum, S. Emrich, T. Lohner, K. Michaelis, A. Brodyanski, R. Merz, M. Kopnarski, B.-R. Höhn, K. Stahl
Industrial Lubrication and Technology 71/8 (2019) 1017-1026; https://doi.org/10.1108/ILT-09-2018-0356

Development of a planarization process for the fabrication of nanocrystalline diamond based photonic structures
J. Heupel, N. Felgen, R. Merz, M. Kopnarski, J.P. Reithmaier, C. Popov
Phys. Status Solidi A (2019) 1900314; https://doi.org/10.1002/pssa.201900314

Microstructuring of titanium surfaces with plasma-modified titanium particles by cold spraying
P. Breuninger, F. Krull, S. Buhl, A. Binder, R. Merz, M. Kopnarski, B. Sachweh, S. Antonyuk
Particuolgy 44 (2019) 90-104; https://doi.org/10.1016/j.partic.2018.08.002

Atomistic insights into lubricated tungsten/diamond sliding contacts
P.A. Romero, L. Mayrhofer, P. Stoyanov, R. Merz, M. Kopnarski, M. Dienwiebel, M. Moseler
Frontiers in mechanical engineering Vol. 5, Article 6 (2019); https://doi.org/10.3389/fmech.2019.00006

Momentum dispersion and mass resolution of magnetic sector instruments for surface analysis
H. Oechsner
Surface and Interface Analysis 51 (2019) 661-666; https://doi.org/10.1002/sia.6635

Oberflächenanalytik: Teil 7: Sekundärteilchen - Kurierdienste für die Oberflächenanalytik (I)
M. Kopnarski
Vakuum in Forschung und Praxis 30(6) (2018) 45-47; https://doi.org/10.1002/vipr.201870607

Absence of free carriers in silicon nanocrystals grown from phosphorous- and boron-doped silicon-rich oxide and oxynitride
D. Hiller, J. López-Vidrier, K. Nomoto, M. Wahl, W. Bock, T. Chlouba, F. Trojánek, S. Gutsch, M. Zacharias, D. König. P. Malý, M. Kopnarski
Beilstein Journal of Nanotechnology 9 (2018) 1501-1511; https://doi.org/10.3762/bjnano.9.141

Ultra-low friction on tetrahedral amorphous diamond-like carbon (ta-C) lubricated with ethylene glycol
S. Bachmann, M. Schulze, L. Krell, R. Merz, M. Wahl, R.W. Stark
Lubricants 6(3) (2018) 59; https://doi.org/10.3390/lubricants6030059

In situ cationization of molecular ions sputtered from organic specimens under cluster bombardment
H. Gnaser, W. Bock. J. Matsuo
Journal of Vacuum Science and Technology B 36(3) (2018) 03F106; https://doi.org/10.1116/1.5009781

Cationization and fragmentation of molecular ions sputtered from polyethylene glycol under gas cluster bombardment: An analysis by MS and MS/MS
P. Thopan, H. Gnaser, R. Oki, T. Aoki, T. Seki, J. Matsuo
International Journal of Mass Spectrometry 430 (2018) 149-157; https://doi.org/10.1016/j.ijms.2018.05.012

Einfluss triboinduzierter Schichten auf Schäden und Reibungsverhalten von Zahnrädern unter besonderer Berücksichtigung des Einlaufvorgangs – experimentelle und analytische Untersuchungen
A. Ziegltrum, S. Emrich, T. Lohner, K. Michaelis, A. Brodyanski, R. Merz, M. Kopnarski, B.-R. Höhn, K. Stahl
Tribologie + Schmierungstechnik, Band 65, Heft 3 (2018) 12-26

Coating of ultra-small micro end mills: analysis of performance and suitability of eight different hard-coatings
M. Bohley, I.G. Reichenbach, S. Kieren-Ehses, L. Heberger, P. Arrabiyeh, R. Merz, L. Böhme, J. Hering, B. Kirsch, M. Kopnarski, E. Kerscher, G. von Freymann, J.C. Aurich
Journal of Manufacturing and Materials Processing 2 (2018) 22; https://doi.org/10.3390/jmmp2020022

Characterization of surface properties of glass vials used as primary packaging material for parenterals
D. Ditter, H.-C. Mahler, H. Roehl, M. Wahl, J. Huwyler, A. Nieto, A. Allmendinger
European Journal of Pharmaceutics and Biopharmaceutics 125 (2018) 58-67; https://doi.org/10.1016/j.ejpb.2017.12.018

Evaluation of glass delamination risk in pharmaceutical 10ml/10R vials
D. Ditter, A. Nieto, H.-C. Mahler, H. Roehl, M. Wahl, J. Huwyler, A. Allmendinger
Journal of Pharmaceutical Sciences 107(2) (2018) 624-637; https://doi.org/10.1016/j.xphs.2017.09.016

Oberflächenanalytik, Teil 6: Primärteilchenquellen - Kanonen für die Oberflächenanalytik (II)
M. Kopnarski
Vakuum in Forschung und Praxis 29(2) (2017) 50-51; https://doi.org/10.1002/vipr.201790015

Boron-incorporating silicon nanocrystals embedded in Si02. Absence of free carriers vs. B-induced defects
D. Hiller, J. López-Vidrier, S. Gutsch, M. Zacharias, M. Wahl, W. Bock, A. Brodyanski, M. Kopnarski, K. Nomoto, J. Valenta, D. König
Scientific Reports 7:8337 (2017) 1-11; https://doi.org/10.1038/s41598-017-08814-0

Quasi-metallic behavior of ZnO grown by atomic layer deposition: The role of hydrogen
H. Beh, D. Hiller, M. Bruns, A. Welle, H.-W. Becker, B. Berghoff, C. Sürgers, R. Merz, M. Zacharias
Journal of Applied Physics 122 (2017) 025306; https://doi.org/10.1063/1.4994175

Charakterisierung von triboinduzierten Schichten in Abhängigkeit des Schmierstoffs bei Verzahnungen
S. Emrich, T. Lohner, A. Ziegltrum, A. Brodyanski, R. Merz, K. Stahl, M. Kopnarski
Tribologie + Schmierungstechnik, Band 64, Heft 5 (2017) 25-32

Removing biofilms from stainless steel without changing surface properties relevant for bacterial attachment
K. Huttenlochner, C. Müller-Renno, C. Ziegler, R. Merz, B. Merz, M. Kopnarski, J. Chodorski, C. Schlegel, R. Ulber
Biointerphases 12 (2017) 02C404; https://doi.org/10.1116/1.4982196

I.A. Alhafez, A. Brodyanski, M. Kopnarski, H.M. Urbassek
Tribology Letters 65, Article Number 26 (2017); https://doi.org/10.1007/s11249-016-0804-6

Ti surface modification by cold spraying with TiO2 microparticles
K. Schmidt, S. Buhl, N. Davoudi, C. Godard, R. Merz, I. Raid, E. Kerscher, M. Kopnarski, C. Müller-Renno, S. Ripperger, J. Seewig, C. Ziegler, S. Antonyuk
Surface & Coatings Technology 309 (2017) 749-758; https://doi.org/10.1016/J.surfcoat.2016.10.091

Lithium-rich albite-topaz-lepidolite granite from Central Vietnam: a mineralogical and geochemical characterization
T. Hien-Dinh, D.A. Dao, T. Tran, M. Wahl, E. Stein, R. Giere
European Journal of Mineralogy 29 (2017) 35-52; https://doi.org/10.1127/ejm/2017/0029-2581

Secondary ion emission from leucine and isoleucine under argon gas-cluster ion bombardment
M. Gnaser, M. Kusakari, M. Fujii, T. Seki. T. Aoki, J. Matsuo
Journal of Vacuum Science & Technology B 34(3) (2016) 03H102; https://doi.org/10.1116/1.4939497

Oberflächen- und Schichtanalytik – Werkzeug für die Oberflächentechnik
S. Emrich, M. Wahl, M. Kopnarski
DGM-Magazin diALOG Materialwissenschaften und Werkstoffmechanik (2016) 24-29

Solvent cleaning and wettability of technical steel and titanium surfaces
S. Becker, R. Merz, H. Hasse, M. Kopnarski
Adsorption Science & Technology 34 (2016) 261-274; https://doi.org/10.1177/0263617416645110

Oberflächenanalytik, Teil 5: Primärteilchenquellen – Kanonen für die Oberflächenanalytik (I)
M. Kopnarski
Vakuum in Forschung und Praxis 28(6) (2016) 49-50; https://doi.org/10.1002/vipr.201690061

Formation probability of metastable molecular hydrogen anions HmDn- (m,n=0-3 and m+n=2, 3) in sputtering
H. Gnaser, R. Golser
International Journal of Mass Spectrometry 410 (2016) 52–56; https://doi.org/10.1016/j.ijms.2016.11.004

Very high cycle fatigue of high-strength steels: Crack initiation by FGA formation investigated at artificial defects
D. Spriestersbach, A. Brodyanski, J. Lösch, M. Kopnarski, E. Kerscher
Procedia Structural Integrity 2 (2016) 1101-1108; https://doi.org/10.1016/j.prostr.2016.06.141

Precise in situ etch depth control of multilayered III-V semiconductor samples with reflectance anisotropy spectroscopy (RAS) equipment
A.-K. Kleinschmidt, L. Barzen, J. Strassner, C. Döring, H. Fouckhardt, W. Bock, M. Wahl, M. Kopnarski
Journal of Nanotechnology 7 (2016) 1783-1793; https://doi.org/10.3762/bjnano.7.171

Plasma surface fluorination of ultrananocrystalline diamond films
W. Kulisch, A. Voss, D. Merker, J.P. Reithmaier, R. Merz, M. Kopnarski, C. Popov
Surface & Coatings Technology 302 (2016) 448-453; https://doi.org/10.1016/j.surfcoat.2016.06.029

Functionalization of nanocrystalline diamond films with phthalocyanines
C. Petkov, P.M. Reintanz, W. Kulisch, A.K. Degenhardt, T. Weidner, J.E. Baio, R. Merz, M. Kopnarski, U. Siemeling, J.P. Reithmaier, C. Popov
Applied Surface Science 379 (2016) 415-423; https://doi.org/10.1016/j.apsusc.2016.04.039

Very high cycle fatigue of bearing steels with artificial defects in vacuum
D. Spriestersbach, A. Brodyanski, J. Lösch, M. Kopnarski, E. Kerscher
Materials Science and Technology 32(11) (2016) 1111-1118; https://doi.org/10.1080/02670836.2015.1119931

Characterization of AlN/AlGaN/GaN:C heterostructures grown on Si(111) using atom probe tomography, secondary ion mass spectrometry, and vertical current-voltage measurements
M. Huber, I. Daumiller, A. Andreev, M. Silvestri, L. Knuuttila, A. Lundskog, M. Wahl, M. Kopnarski, A. Bonanni
Journal of Applied Physics 119 (2016) 125701; http://dx.doi.org/10.1063/1.4944652

On the effect of plastic deformation (PD) additives in lubricants
T. Lohner, R. Merz, J. Mayer, K. Michaelis, M. Kopnarski, K. Stahl
Tribologie + Schmierungstechnik, 62. Jahrgang 2/2015, S. 13-24

Nanocone formation on ion-bombarded InP surfaces
D. Kramczynski, H. Gnaser
Applied Surface Science 355 (2015) 653-659; https://doi.org/10.1016/j.apsusc.2015.07.156

Location and electronic nature of phosphorus in the Si nanocrystal-SiO2 system
D. König, S. Gutsch, H. Gnaser, M. Wahl, M. Kopnarski, J. Göttlicher, R. Steininger, M. Zacharias, D. Hiller
Scientific Reports 5 (2015) Article No. 9702; https://doi.org/10.1038/srep09702

Characterization of ion-irradiation-induced nanodot structures on InP surfaces by atom probe tomography
H. Gnaser, T. Radny
Ultramicroscopy 159 (2015) 232-239; https://doi.org/10.1016/j.ultramic.2015.04.020

Oberflächenanalytik, Teil 4: Sputtering - Atomarer Löffel für die Massenspektrometrie
M. Kopnarski
Vakuum in Forschung und Praxis Vol. 27, Nr. 5 (2015) 35-37; https://doi.org/10.1002/vipr.201590049

Oberflächenanalytik, Teil 3: Sputtering - Atomare Grabungstechnik für die Oberflächenanalytik
M. Kopnarski
Vakuum in Forschung und Praxis Vol. 27, Nr. 2 (2015) 42-43; http://dx.doi.org/10.1002/vipr.201590016

Influence of plasma composition on reflectance anisotropy spectra for in situ III-V semiconductor dry-etch monitoring
L. Barzen, A.-K. Kleinschmidt, J. Strassner, C. Doering, H. Fouckhardt, W. Bock, M. Wahl, M. Kopnarski
Applied Surface Science 357 (2015) 530-538; https://doi.org/10.1016/j.apsusc.2015.09.040

Molecular cluster emission in sputtering of amino acids by argon gas-cluster ions
M. Kusakari, H. Gnaser, M. Fujii, T. Seki, T. Aoki, J. Matsuo
International Journal of Mass Spectrometry 383-384 (2015) 31-37; https://doi.org/10.1016/j.ijms.2015.04.003

On the role of oxidation in tribological contacts under environmental conditions
R. Merz, A. Brodyanski, M. Kopnarski
Conference Papers in Science, Hindawi Publishing Corporation, London, Volume 2015, Article ID 515498, 11 pages (2015); https://doi.org/10.1155/2015/515498

Surface analysis of chain joint components after tribological load and usage of anti-wear additives
D. Sappok, R. Merz, B. Sauer, M. Kopnarski
Conference Papers in Science, Hindawi Publishing Corporation, London, Volume 2015, Article ID 407048, 12 pages (2015); https://doi.org/10.1155/2015/407048

Nanoscratching of iron: A molecular dynamics study of the influence of surface orientation and scratching direction
Y. Gao, A. Brodyanski, M. Kopnarski, H. Urbassek
Computational Materials Science 103 (2015) 77-89; https://doi.org/10.1016/j.commatsci.2015.03.011

Electronic properties of phosphorus doped silicon nanocrystals embedded in SiO2
S. Gutsch, J. Laube, D. Hiller, W. Bock, M. Wahl, M. Kopnarski, H. Gnaser, B. Puthen-Veettil, M. Zacharias
Applied Physics Letters 106 (2015) 113103; https://doi.org/10.1063/1.4915307

Surface softening in metal-ceramic sliding contacts: An experimental and numerical investigation
P. Stoyanov, R. Merz, P.A. Romero, F.C. Wählisch, O.T. Abad, R. Gralla, P. Stemmer, M. Kopnarski, M. Moseler, R. Bennewitz, M. Dienwiebel
American Chemical Society Vol. 9, No. 2 (2015) 1478-1491; https://doi.org/10.1021/nn505968m

Monitoring of (reactive) ion etching (RIE) with reflectance anisotropy spectroscopy (RAS) equipment
L. Barzen, J. Richter, H. Fouckhardt, M. Wahl, M. Kopnarski
Applied Surface Science 328 (2015) 120-124; https://doi.org/10.1016/j.apsusc.2014.12.038

Surface structuring of case hardened chain pins by cold-sprayed microparticles to modify friction and wear properties
S. Buhl, K. Schmidt, D. Sappok, R. Merz, C. Godard, E. Kerscher, M. Kopnarski, B. Sauer, S. Antonyuk, S. Ripperger
Particuology 21 (2015) 32-40; https://doi.org/10.1016/j.partic.2014.10.001

Atomar aufgelöste Element- und Isotopenanalyse in 3D
M. Wahl, H.-U. Ehrke
Sonderhefte Physik Journal, Best of 2014, S. 12-16

Sekundärneutralteilchen-Massenspektrometrie (SNMS) - Anwendung bei der Charakterisierung von Pulver- und Partikelproben
S. Passlack, M. Kopnarski
Vakuum in Forschung und Praxis Vol. 26 Nr. 6 (2014) 38-44; DOI: 10.1002/vipr.201400569

Oberflächenanalytik, Teil 2: Grundlegende Konzepte
M. Kopnarski
Vakuum in Forschung und Praxis Vol. 26 Nr. 5 (2014) 42-43; DOI: 10.1002/vipr.201490046

Oberflächenanalytik, Teil 1: Einführung
M. Kopnarski
Vakuum in Forschung und Praxis Vol. 26 Nr. 4 (2014) 47-48; DOI: 10.1002/vipr.201490035

Profilic cluster emission in sputtering of phenylalanine by argon-cluster ion bombardment
H. Gnaser, M. Fujii, S. Nakagawa, T. Seki, T. Aoki, J. Matsuo
International Journal of Mass Spectrometry 350 (2014) 54-57; DOI.org/10.1016/j.ijms.2013.12.024

Dynamics of L-phenylalanine sputtering by argon cluster bombardment
C. Müksch, C. Anders, H. Gnaser, H.M. Urbassek
J. Phys. Chem. C 118 (2014) 7962-7970; DOI: 10.1021/jp412348t

Wavelength-dependent ripple propagation on ion-irradiated prepatterned surfaces driven by viscous flow corroborates two-field continuum model
D. Kramczynski, B. Reuscher, H. Gnaser
Physical Review B 89 (2014) 205422; DOI: 10.1103/PhysRevB.89.205422

Self-organizing nanodot structures of InP surfaces evolving under low-energy ion irradiation: analysis of morphology and composition
T. Radny, H. Gnaser
Nanoscale Research Letters 9 (2014) 403

Enhanced ionization sputtering: A concept for superior industrial coatings
J. Alami, Z. Maric, H. Busch, F. Klein, U. Grabowy, M. Kopnarski
Surface and Coatings Technology 255 (2014) 43-51; Doi.org/10.1016/j.surfcoat.2013.11.040

Charakterisierung des Wirkpaarverhaltens anhand von Spanbildungs- und Oberflächenuntersuchungen
M. Bohley, R. Merz, C. Müller-Renno, I.G. Reichenbach, N. Davoudi, C. Ziegler, M. Kopnarski, J.C. Aurich
wt Werkstattstechnik online, Heft 9 (2014) 586-591

Atom probe tomography of nanostructures
H. Gnaser
Surface and Interface Analysis 46 (2014) 383–388; DOI 10.1002/sia5507

Atom probe tomography study of Mg-doped GaN layers
S. Khromov, D. Gregorius, R. Schiller, J. Lösch, M. Wahl, M. Kopnarski, H. Amano, B. Monemar, L. Hultmann, G. Pozina
Nanotechnology 25 (2014) 275701; DOI: 10.1088/0957-4484/25/27/275701

Innovative direct nanoparticle dispersion injection into injection molding processing
I. Hassinger, T. Becker, R. Walter, T. Burkhart, M. Kopnarski, A. Brodyanski
Journal of Applied Polymer Science (2014) 40641; DOI:10.1002/app.40641

Nanoscale sliding friction phenomena at the interface of diamond-like carbon and tungsten
P. Stoyanov, P.A. Romero, R. Merz, M. Kopnarski, M. Stricker, P. Stemmer, M. Dienwiebel, M. Moseler
Acta Materialia 67 (2014) 395–408

Comprehensive modelling of secondary-ion energy spectra measured with a magnetic sector field instrument: II. Evaluation of experimental data
K. Wittmaack, H. Gnaser
International Journal of Mass Spectrometry 358 (2014) 49-58

Phosphorus doping of Si nanocrystals embedded in silicon oxynitride determined by atom probe tomography
H. Gnaser, S. Gutsch, M. Wahl, R. Schiller, M. Kopnarski, D. Hiller, M. Zacharias
Journal of Applied Physics 115 (2014) 034304

Influence of heat treatments on the mechanical properties of ultrasonic welded AA 2024/CF-PA66-joints
F. Balle, S. Huxold, S. Emrich, G. Wagner, M. Kopnarski, D. Eifler
Advanced Engineering Materials 15 (2013) 837-845; DOI: 10.1002/adem.201200301

Sputtered ion emission under size-selected Ar_n⁺ cluster ion bombardment
H. Gnaser, K. Ichiki, J. Matsuo
Surf. Interface Anal. 45 (2013) 138-142; DOI: 10.1002/sia.4914

Peptide dissociation patterns in secondary-ion mass spectrometry under large argon-cluster ion bombardment
H. Gnaser, M. Fujii, S. Nakagawa, T. Seki, T. Aoki, J. Matsuo
Rapid Commun. Mass Spectrom. 27 (2013) 1490-1496; DOI: 10.1002/rcm.6599

Grafting of manganese phthalocyanine on nanocrystalline diamond films
C. Petkov, U. Glebe, E. Petkov, A. Pasquarelli, C. Pietzka, M. Veres, L. Himics, R. Merz, W. Kulisch, U. Siemeling, J.P. Reithmaier, C. Popov
Physica Status Solidi A 210, No. 10 (2013) 2048–2054; DOI: 10.1002/pssa.201300038

Atomic relocation in ion-bombarded ultra-thin films analyzed with sub-nm spatial resolution
H. Gnaser, R. Schiller, M. Wahl, B. Reuscher
Nuclear Instruments and Methods in Physics Research B 315 (2013) 126-130; doi.org/10.1016/j.nimb.2013.04.013

Ein Bild sagt mehr als tausend Worte: Anwendungen der 3D-Atomsonden-Tomografie in der Dünnschicht- und Nanoanalytik
M. Wahl, H. Gnaser, M. Kopnarski
Vakuum in Forschung und Praxis 25 Nr. 6 (2013) 29-36; DOI: 10.1002/vipr.201300541

Die Welt ist keine Scheibe - Vom Feldionenmikroskop zur Atomsonden Tomografie
M. Wahl, H. Gnaser, M. Kopnarski
Vakuum in Forschung und Praxis 25 Nr. 5 (2013) 24-29; DOI: 10.1002/vipr.201300537

Discussion Reply on „Sputtering of dimers off a silicon surface“
M.L. Nietiadi, Y. Rosandi, M. Kopnarski, H.M. Urbassek
Nuclear Instruments and Methods in Physics Research Section B 302 (2013) 57

Discussion - Comments on „Sputtering of dimers off a silicon surface“ by M.I. Nietiadi et al.
H. Oechsner
Nuclear Instruments and Methods in Physics Research B 302 (2013) 55-56

Optimizing the spin-pumping induced inverse spin Hall voltage by crystal growth in Fe/Pt bilayers
E.Th. Papaioannou, P. Fuhrmann, M.B. Jungfleisch, T. Brächer, P. Pirro, V. Lauer, J. Lösch, B. Hillebrands
Applied Physics Letters 103 (2013) 162401

Characterization of long-term durability of induction welded aluminum/carbon fiber reinforced polymer-joints
M. Didi, S. Emrich, P. Mitschang, M. Kopnarski
Advanced Engineering Materials 15 (2013) 821–829; DOI: 10.1002/adem.201200288

Ion optical effects in a low pressure rf plasma
H. Oechsner, H. Paulus
J. Vac. Sci. Technol. A 31 (2013) 061309-1

Supermolecular morphology of polypropylene filled with nanosized silica
A.K. Schlarb, D.N. Suwitaningsih, M. Kopnarski, G. Niedner-Schatteburg
Journal of Applied Polymer Science (2013); DOI: 10.1002/app.39655

Friction and wear mechanisms of tungsten-carbon systems: A comparison of dry and lubricated conditions
P. Stoyanov, P. Stemmer, T.T. Järvi, R. Merz, P.A. Romero, M. Scherge, M. Kopnarski, M. Moseler, A. Fischer, M. Dienwiebel
ACS Applied Materials and Interfaces 5(13) (2013) 6123-6135; DOI: 10.1021/am4010094

Influence of the shaping on tribological properties of PEEK-coated U-shaped metal-profiles
L.E. Josch, V. Götz, C. Römer, N. Konchakova, S. Emrich, C. Wagner, R. Müller, M. Kopnarski, A.K. Schlarb
Advanced Engineering Materials 15 (2013) 830-836, DOI: 10.1002/adem.201200274

Enhancing the lifetime of MoS₂-lubricated ball bearings
M. Marquart, M. Wahl, S. Emrich, G. Zhang, B. Sauer, M. Kopnarski, B. Wetzel
Wear 303 (2013) 169–177

Improvement of ultrasonically welded aluminum/carbon fiber reinforced polymer-joints by surface technology and high resolution analysis
F. Balle, S. Emrich, G. Wagner, D. Eifler, A. Brodyanski, M. Kopnarski
Advanced Engineering Materials 15 (2013) 814-820; DOI: 10.1002/adem.201200282

Innovative Leichtbau-Fügetechnologien - Vakuum gestützte Analyseverfahren zur Aufklärung und Optimierung von Interface-Eigenschaften
S. Emrich, M. Kopnarski
Vakuum in Forschung und Praxis Vol. 25 Nr. 1 (2013) 27-33; DOI: 10.1002/vipr.201300510

Facile synthesis of monodisperse maghemite and ferrite nanocrystals from metal powder and octanoic acid
K.S.M. Salih, P. Mamone, G. Dörr, T.O. Bauer, A. Brodyanski, C. Wagner, M. Kopnarski, R.N. Klupp Taylor, S. Demeshko, F. Meyer, V. Schünemann, S. Ernst, L.J. Gooßen, W.R. Thiel
Chemistry of Materials 25 (2013) 1430-1435; DOI: 10.1021/cm303344z

Energy spectra of sputtered ions: assessment of the instrumental resolution
H. Gnaser
Surface and Interface Analysis 45 (2013) 79-82

Mechanism of fatigue crack initiation and propagation in the very high cycle fatigue regime of high-strength steels
P. Grad, B. Reuscher, A. Brodyanski, M. Kopnarski, E. Kerscher
Scripta Materialia A 67 (2012) 838-841

Fabricating high-density magnetic storage elements by low-dose ion beam irradiation
R. Neb, T. Sebastian, P. Pirro, B. Hillebrands, S. Pofahl, R. Schäfer, B. Reuscher
Applied Physics Letters 101 (2012) 112406

Propagation of nanoscale ripples on ion-irradiated surfaces
H. Gnaser, B. Reuscher, A. Zeuner
Nuclear Instruments and Methods in Physics Research Section B 285 (2012) 142–147

Exact compositional analysis of SiGe alloys by matrix effect compensated MCs⁺-SIMS
B. Saha, P. Chakraborty, H. Gnaser, M. Sharma, M.K. Sanyal
Applied Physics A 108 (2012) 671-677

Sputtering of dimers off a silicon surface
M.L. Nietiadi, Y. Rosandi, M. Kopnarski, H.M. Urbassek
Nuclear Instruments and Methods in Physics Reseach B 289 (2012) 97-99

Atom probe tomopraphy of ion-irradiated ultra-thin Fe/Cr/Fe trilayers with sub-nm spatial resolution
H. Gnaser, R. Schiller, M. Wahl, B. Reuscher, A. Zeuner, M. Kopnarski, R. Neb, B. Hillebrands
J. Phys. D: Appl. Phys. 45 (2012) 505303

Spectrally wide-band terahertz wave modulator based on optically tuned graphene
P. Weis, J.L. Garcia-Pomar, M. Höh, B. Reinhard, A. Brodyanski, M. Rahm
ACS Nano 6(10) (2012) 9118-9124

Low temperature growth of nanocrystalline and ultrananocrystalline diamond films: A comparison
W. Kulisch, C. Petkov, E. Petkov, C. Popov, P.N. Gibson, M. Veres, R. Merz, B. Merz, J.P. Reithmaier
Phys. Status Solidi A 209(9) (2012) 1664-1674; DOI 10.1002/pssa.201228270

Methoden der Oberflächen- und Schichtanalytik
M. Kopnarski
Handbuch Technische Keramische Werkstoffe, Hrsg. J. Kriegesmann (2012) Kap. 6.1.1.0, S. 1-27

Temperature-dependent grain growth and phase transformation in mixed anatase-rutile nanocrystalline TiO₂ films
H. Gnaser, J. Lösch, A. Orendorz, C. Ziegler
Phys. Status Solidi A 208 (2011) 1635–1640 / DOI 10.1002/pssa.201026784

Analyse des Risswachstums ausgehend von nichtmetallischen Einschlüssen
P. Grad, B. Reuscher, A. Brodyanski, M. Kopnarski, E. Kerscher
A. Wanner, M. Rettenmayr: Fortschritte in der Metallographie. Sonderbände der Praktischen Metallographie, Hrsg.: G. Petzow, 43 (2011) 177-182

Electron-Impact (EI) Secondary Neutral Mass Spectrometry (SNMS)
M. Kopnarski, H. Jenett
Surface and Thin Film Analysis 2nd Edition, ed. G. Friedbacher, H. Bubert (Wiley-VCH 2011) S. 161-177

BSA adsorption on titanium: ToF-SIMS investigation of the surface coverage as a function of protein concentration and pH-value
M. Wilhelmi, C. Müller, C. Ziegler, M. Kopnarski
Anal Bioanal Chem (2011) 400:697-701

Plasma amination of ultrananocrystalline diamond/amorphous carbon composite films for the attachment of biomolecules
H. Koch, W. Kulisch, C. Popov, R. Merz, B. Merz, J.P. Reithmaier
Diamond & Related Materials 20 (2011) 254–258

Interplay of energy dissipation, ion-induced mixing, and crystal structure recovery, and surface effects in ion-irradiated magnetic Fe/Cr/Fe trilayers
A. Brodyanski, S. Blomeier, H. Gnaser, W. Bock, B. Hillebrands, M. Kopnarski, B. Reuscher
Physical Review B84 (2011) 214106

Secondary Neutral Mass Spectrometry with Plasma-Postionisation
H. Oechsner
In: Encyclopedia of Mass Spectrometry, Vol. 5, ed. D. Beauchemin and D.E. Matthews, Elsevier 2010, pp 455-469

Determination of OH groups at plasma oxidized polypropylene by TFAA chemical derivatization XPS: An inter-laboratory comparison
T. Gross, F. Pippig, B. Merz, R. Merz, U. Vohrer, R. Mix, H. Steffen, W. Bremser, W.E.S. Unger
Plasma Processes and Polymers (2010) 494-503

TOF-SIMS investigations of adsorbed proteins on dental titanium
J. Wald, C. Müller, M. Wahl, W. Hoth-Hannig, M. Hannig, M. Kopnarski, C. Ziegler
Phys. Status Solidi A 207, No. 4 (2010) 831-836; DOI: 10.1002/pssa.200983308

Auswirkung von Ethanol E85 auf Schmierstoffalterung und Verschleiß im Ottomotor
L. Brouwer, S. Emrich, G. Knoll, M. Kopnarski, C. Longo, H. Schwarze
MTZ 04/2010 Jg. 71; S. 286-290

Phonons of solid phases (α,β,δ,ε) of carbon monoxide by optical studies
A. Serdyokov, M. Vetter, A. Brodyanski, H.J. Jodl
Fizika Nizkikh Temperatur 36 (2010) 532-548

Plasma based Secondary Neutral Mass Spectrometry
H. Oechsner
In Encyclopedia of Mass Spectrometry, Vol. 5 (2009), Elsevier, Oxford UK

Etch features revealed on Si(100) by wet chemical etching with solutions containing potassíum ions
J. Mähliß, H. Höynck, A. Abbadie, F. Brunier, R. Merz, A. Brodyanski, B.O. Kolbesen
ECS Transactions 19, Issue 23 (2009) 33-37

Induction heated joining of aluminum and carbon fiber reinforced nylon 66
P. Mitschang, R. Velthuis, S. Emrich, M. Kopnarski
Journal of Thermoplastic Composite Materials 22 (2009) 767-801

Micro–macro characterisation of DGEBA-based epoxies as a preliminary to polymer interphase modelling
G. Possart, M. Presser, S. Passlack, P.L. Geiß, M. Kopnarski, A. Brodyanski, P. Steinmann
International Journal of Adhesion & Adhesives 29 (2009) 478–487

Problem of catalyst ageing during the hot-wire chemical vapour deposition of thin silicon films
D. Hrunski , M. Scheib, R. Merz, B. Schröder
Thin Solid Films 517 (2009) 3370–3377

Nanostrukturierte Oberflächen: Optimierung der Langzeitbeständigkeit struktureller Aluminiumklebungen
S. Emrich, M. Kopnarski
Vakuum in Forschung und Praxis 21 (2009) Nr. 2, A24-A28

Surface Analysis in Nanotechnology
H. Oechsner
Journal of Nanoscience and Nanotechnology Vol. 9, No. 7 (2009) 3999-4007

Operation and application of a new time-of-flight e-gas secondary neutral mass spectrometer (ToF–SNMS)
M. Kopnarski, J. Lösch, L. Simeonov
Anal. Bioanal. Chem. 393 (2009) 1913-1916

Quantitative characterization of solid state phases by secondary neutral mass spectrometry
H. Oechsner, R. Getto, M. Kopnarski
J. Appl. Phys 105 (2009) 063523-1 - 063523-6

Chemical and structural characterisation of DGEBA-based epoxies by time of flight secondary ion mass spectrometry (ToF-SIMS) as a preliminary to polymer interphase characterisation
S. Passlack, A. Brodyanski, W. Bock, M. Kopnarski, M. Presser, P.L. Geiß, G. Possart, P. Steinmann
Anal. Bioanal. Chem. 393 (2009) 1879-1888

Exchange interaction and magnetic domain formation in periodically inhomogeneous magnetic media
S. Blomeier, B. Hillebrands, B. Reuscher, A. Brodyanski, M. Kopnarski, R.L. Stamps
Physical Review B 77 (2008) 094405-1 - 094405-8

Theoretical background and some applications of ECWR-plasmas
H.Oechsner
Vacuum 83 (2008) 727-731

Secondary emission of MCs_n⁺ molecular ions under the joint influence of electropositive and electronegative elements
B. Saha, S. Sarkar, P. Chakraborty, H. Gnaser
Surface Science 602 (2008) 1061-1065

Focused ion beam implantation of Ga in nanocrystalline diamond: Fluence-dependent retention and sputtering
H. Gnaser, B. Reuscher, A. Brodyanski
Nuclear Instruments and Methods in Physics Research B 266 (2008) 1666-1670

Isotope fractionation of sputtered anions: C־ and C^-₂
H. Gnaser
Nuclear Instruments and Methods in Physics Research B 266 (2008) 37-43

Photocatalytic decomposition of methylene blue and 4-chlorophenol on nanocrystalline TiO₂ films under UV illumination: A ToF-SIMS study
A. Orendorz, C. Ziegler, H. Gnaser
Applied Surface Science 255 (2008) 1011-1014

Protein films adsorbed on experimental dental materials: ToF-SIMS with multivariate data analysis
F. Bernsmann, N. Lawrence, M. Hannig, C. Ziegler, H. Gnaser
Anal. Bioanal. Chem. 391 (2008) 545-554

Focused ion beam implantation of Ga in Si and Ge: fluence-dependent retention and surface morphology
H. Gnaser, A. Brodyanski, B. Reuscher
Surf. Interface Anal. 40 (2008) 1415-1422

Dynamic computer simulations of Cs incorporation in Si during low-energy (0.2-3 keV) irradiation
H. Gnaser
Surf. Interface Anal. 40 (2008) 1367-1373

Investigation of silicon contamination of Ta filaments used for thin film silicon deposition
D. Hrunski , B. Schroeder , M. Scheib , R. M. Merz , W. Bock , C. Wagner
Thin Solid Films 516 (2008) 818–821

Ölalterung und Verschleiß im Ottomotor
L. Brower, S. Emrich, G. Knoll, M. Kopnarski, U. Müller-Frank, F. Schlerege, H. Schwarze
MTZ 10/2008 Jg. 69, S. 878-886

Fügen artfremder Werkstoffe – Ultraschallschweißen von Kohlenstofffasertextilien mit Metallen
F. Balle, S. Emrich, G. Wagner, D. Eifler
MP Materials Testing 50, Heft 4 (2008) 184-189

Identification of the SiF₆^2- dianion by accelerator mass spectrometry and a fully relativistic computation of its photodetachment spectrum
H. Gnaser, R. Golser, M. Pernpointner, O. Forstner, W. Kutschera, A. Priller, P. Steier, A. Wallner
Phys. Rev. A 77 (2008) 053203-1 - 053203-7

Compositional and structural evolution of the titanium dioxide formation by thermal oxidation
W.-F. Su, H. Gnaser, Y.-L. Fan, Z.-M. Jiang, Y.-K. Le
Chinese Physics B 17 (2008) 3003-3007

Ölwechseloptimierter Ottomotor: Untersuchung des Einflusses der Schmierstoffalterung auf das Verschleißverhalten der Tribosysteme im Ottomotor bei verlängerten Ölwechselintervallen
L. Brouwer, S. Emrich, G. Knoll, M. Kopnarski, F. Schlerege, H. Schwarze, M. Wolf
Abschlussbericht FVV-Vorhaben Nr. 848, Heft 837 (2007)

Thin niobium/boron bilayers and multilayers annealed via Rapid Thermal Processing (RTP)
R. Mertens, W. Bock, B. Lommel, B.O. Kolbesen
Phys. Stat. Sol. © 4, No. 6 (2007) 1852-1858

Structural investigation of pristine and annealed nanocrystalline TiO₂ thin films by X-ray diffraction and Raman spectroscopy
A. Orendorz, A. Brodyanski, J. Lösch, L.H. Bai, Z.H. Chen, Y.K. Le, C. Ziegler, H. Gnaser
Phys. Stat. Sol. © 4, No. 6 (2007) 1822–1829

Secondary-neutral time-of-flight mass spectrometer (SNMS-ToF) working in direct bombardment mode (DBB)
M. Kopnarski, L. Simeonov
Comptes rendus de l´Académie bulgare des Sciences, Tome 60, No. 5 (2007) 505-510

Evaluation of the particle detection ability of a micro-channel plate detector in an SNMS-ToF analyser
L. Simeonov, M. Kopnarski
Comptes rendus de l´Académie bulgare des Sciences, Tome 60, No. 5 (2007) 501-504

Phase transformation and particle growth in nanocrystalline anatase TiO₂ thin films analyzed by X-ray diffraction and Raman spectroscopy
A. Orendorz, A. Brodyanski, J. Lösch, L.H. Bai, Z.H. Chen, Y.K. Le, C. Ziegler, H. Gnaser
Surface Science 601 (2007) 4390-4394

Annealing of evaporated and sputtered niobium films in oxygen and nitrogen rich atmospheres by Rapid Thermal Processing (RTP)
V.A. Matylitskaya, O. Brunkahl, G. Kothleitner, W. Bock, B.O. Kolbesen
Phys. Stat. Sol. © 4, No. 6 (2007) 1802-1816

Ion beam induced modification of exchange interaction and spin–orbit coupling in the Co₂FeSi Heusler compound
J. Hamrle, S. Blomeier, O. Gaier, B. Hillebrands, H. Schneider, G. Jakob, B. Reuscher, A. Brodyanski, M. Kopnarski, K. Postava, C. Felser
J. Phys. D: Appl. Phys. 40 (2007) 1558–1562

Orientational order in the molecular solids N₂, CO, and O₂ investigated via combined excitations with FTIR
M. Vetter, A.P. Brodyanski, S.A. Medvedev, H.-J. Jodl
Physical Review B 75 (2007) 014305-1 - 014305-13

From optical spectra to phase diagrams — the binary mixture N₂–CO
M. Vetter, H.-J.Jodl, A. Brodyanski
Fizika Nizkikh Temperatur Vol. 33, No. 12 (2007) 1383-1392

Ion beam-induced magnetic nanopatterning of interlayer exchange coupled Fe/Cr/Fe trilayers
S. Blomeier, P. Candeloro, B. Hillebrands, B. Reuscher, A. Brodyanski, M. Kopnarski
Journal of Magnetism and Magnetic Materials 310 (2007) 2353-2355

Nanoanalysis with electron spectroscopic methods
R. Merz
NanoS Guide, Wiley-VCH, Weinheim (2007) 36-45

Mehrschichtverbundsysteme bei Grenzreibung – Zur Tribologie von Polyetheretherketon unter Grenzreibung
A. Gebhard, F. Haupert, S. Emrich, M. Kopnarski, A.K. Schlarb
IVW-Bericht 06-032 (2006)

Diskontinuierliches Induktionsschweißen von Metall/Faser-Kunststoff-Verbunden
R. Velthuis, M. Bos, S. Emrich, S. Schmeer, U. Huber, M. Kopnarski, M. Maier, P. Mitschang, R. Renz
IVW Schriftenreihe Band 68 (2006) 178-179

Abscheidung, Charakterisierung und Anwendung von Plasma-Polymerschichten auf HMDSO-Basis
B. Jacoby, W. Bock, M. Haupt, H. Hilgers, M. Kopnarski, J. Molter, C. Oehr, T. Rühle, M. Wahl
Vakuum in Forschung und Praxis 18 (2006) 12–18

Growth conditions of the cubic phase cBN in boron nitride films
H. Oechsner
Thin Solid Films 515 (2006) 33-38

On the nucleation of the cubic phase in boron nitride films
J. Ye, H. Oechsner
Thin Solid Films 514 (2006) 138-144

Micromagnetism and magnetization reversal of embedded ferromagnetic elements
S. Blomeier, P. Candeloro, B. Hillebrands, B. Reuscher, A. Brodyanski, M. Kopnarski
Physical Review B 74 (2006) 184405-1 - 184405-12

Chemical phase analysis in nanoscaled films by SNMS
H. Oechsner, R. Getto
Proc. 14^th Int. Conf. on Composites/Nano Engineering ICCE 14, (Boulder, Colorado), ed. D. Hui (2006)

Verification of long-lived molecular hydrogen anions (H_n^-, D_n^-, n=2,3) by secondary-ion mass spectrometry
H. Gnaser, R. Golser
Physical Review A 73 (2006) 021202-1 - 021202-4

Structural transformation in nanocrystalline anatase TiO₂ films upon annealing in air
A. Orendorz, A. Brodyanski, J. Lösch, L.H. Bai, Z.H. Chen, Y.K. Le, C. Ziegler, H. Gnaser
Surface Science 600 (2006) 4347-4351

ToF-SIMS study of photocatalytic decomposition reactions on nanocrystalline TiO₂-films
H. Gnaser, A. Orendorz, C. Ziegler, E. Rowlett, W. Bock
Applied Surface Science 252 (2006) 6996-6999

Comparing the chemical properties of evaporated and sputtered niobium films on oxidized Si(100) wafers - preparation of oxynitride films
O. Brunkahl, W. Bock, K. Thoma, B.O. Kolbesen
Applied Surface Science 252 (2005) 177-184
https://doi.org/10.1016/j.apsusc.2005.02.015

ToF-SIMS characterisation of ultra-thin fluorinated carbon plasma polymer films
M. von Gradowski, B. Jacoby, H. Hilgers, J. Barz, M. Wahl, M. Kopnarski
Surface and Coatings Technology 200 (2005) 334-340
https://doi.org/10.1016/j.surfcoat.2005.02.068

Magnetic patterning of Fe/Cr/Fe(001) trilayers by Ga⁺ ion irradiation
S. Blomeier, B. Hillebrands, V.E. Demidov, S.O. Demokritov, B. Reuscher, A. Brodyanski, M. Kopnarski
Journal of Applied Physics 98 (2005) 093503-1 - 093503-6
https://doi.org/10.1063/1.2125116

Atomic vapor deposition of Ru and RuO₂ thin film layers for electrode applications
C. Manke, S. Miedl, O. Boissiere, P. Baumann, J. Lindner, M. Schumacher, A. Brodyanski, M. Scheib
Microelectronic Engineering 82 (2005) 242-247
https://doi.org/10.1016/j.mee.2005.07.030

Fe(001) on vicinal Au(001): correlation of topography and magnetic surface anisotropy
M. Rickart, T. Mewes, S.O. Demokritov, B. Hillebrands
Journal of Physics D: Applied Physics 38 (2005) 1047-1054
http://dx.doi.org/10.1088/0022-3727/38/7/013

Nanocrystalline anatase TiO₂ thin films: preparation and crystallite size-dependent properties
B. Huber, A. Brodyanski, M. Scheib, A. Orendorz, C. Ziegler, H. Gnaser
Thin Solid Films 472 (2005) 114-124
https://doi.org/10.1016/j.tsf.2004.06.120

nm-scale resolution studies of the bond interface between ultrasonically welded Al-alloys by an analytical TEM: a path to comprehend bonding phenomena?
A. Brodyanski, B. Born, M. Kopnarski
Applied Surface Science 252 (2005) 94-97
https://doi.org/10.1016/j.apsusc.2005.02.003

A combined SNMS and EFTEM/EELS study of focused ion beam prepared vanadium nitride thin films
G. Kothleitner, M. Rogers, A. Berendes, W. Bock, B.O. Kolbesen
Applied Surface Science 252 (2005) 66-76
https://doi.org/10.1016/j.apsusc.2005.02.013

Charakterisierung von Plasma-Polymerfilmen mittels Flugzeit-Sekundärionen-Massenspektrometrie (ToF-SIMS)
M. von Gradowski, M. Wahl, B. Jacoby, H. Hilgers, M. Kopnarski
Vakuum in Forschung und Praxis 17, Nr. 2 (2005) 73-79
https://doi.org/10.1002/vipr.200500248

Quantitative determination of surface properties of plasma polymer films
M. von Gradowski, H. Hilgers, B. Jacoby, M. Wahl, M. Kopnarski
NanoS – The Nanotech Journal 02.05 (2005) 25-29

Multivariate characterization of ultra-thin nanofunctional plasma polymer films using ToF-SIMS analysis
M. von Gradowski, M. Wahl, R. Förch, H. Hilgers
Surface and Interface Analysis 36 (2004) 1114-1118
https://doi.org/10.1002/sia.1853

Surface Analysis: Secondary neutral mass spectrometry
H. Oechsner
Encyclopedia of Analytical Science, Vol. 8 (2004) 514-526
http://dx.doi.org/10.1016/B978-0-12-409547-2.00526-6

On the stoichiometry condition for the formation of cubic boron nitride films
Y.K. Le, H. Oechsner
J. Appl. Phys. A 78 (2004) 681-685
https://doi.org/10.1007/s00339-003-2281-7

Detection in the ppm-range and high resolution depth profiling with the new SNMS instrument INA-X
J. Jorzick, J. Lösch, M. Kopnarski, H. Oechsner
J. Appl. Phys. A 78 (2004) 655-658
https://doi.org/10.1007/s00339-003-2275-5

Effect of concurrent N₂⁺ and N⁺ ion bombardment on the physical vapour deposition of nitrodes thin films
Z.X. Cao, H. Oechsner
J. Vac. Sci. Technol. A 22 (2004) 321-323
https://doi.org/10.1116/1.1644112

Energetics of MCs_n⁺ molecular ions emitted from Cs⁺ irradiated surfaces
S. Sarkar, P. Chakraborty, H. Gnaser
Physical Review B 70 (2004) 195427-1 – 195427-5
https://doi.org/10.1103/PhysRevB.70.195427

Analysis of doubly-charged negative molecules by accelerator mass spectrometry
R. Golser, H. Gnaser, W. Kutschera, A. Priller, P. Steier, C. Vockenhuber
Nucl. Instrum. and Methods in Phys. Res. B 223-224 (2004) 221-226
https://doi.org/10.1016/j.nimb.2004.04.045

Steam reforming of methanol over Cu/CeO₂/γ-Al₂O₃ catalysts in a microchannel reactor
Y. Men, H. Gnaser, R. Zapf, V. Hessel, C. Ziegler, G. Kolb
Applied Catalysis A. General 277 (2004) 83-90
https://doi.org/10.1016/j.apcata.2004.08.035

Correlation between topography and magnetic surfaces anisotropy in epitaxial Fe films on vicinal-to-(001) Au surfaces with different step orientation
M. Rickart, T. Mewes, M. Scheib
Physical Review B 70 (2004) 060408
https://doi.org/10.1103/PhysRevB.70.060408

Cathodic arc evaporation of (Ti,Al)N coatings and (Ti,Al)N/TiN multilayer-coatings – correlation between lifetime of coated cutting tools, structural and mechanical film properties
F.R. Weber, F. Fontaine, M. Scheib, W. Bock
Surface and Coatings Technology 177-178 (2004) 227-232
https://doi.org/10.1016/j.surfcoat.2003.09.037

Secondary-ion mass spectrometry (SIMS) analysis of catalyst coatings used in microreactors
H. Gnaser, W. Bock, E. Rowlett, Y. Men, C. Ziegler, R. Zapf, V. Hessel
Nuclear Instruments and Methods in Physics Research B 219-220 (2004) 880-885
https://doi.org/10.1016/j.nimb.2004.01.181

Fast preparation and testing methods using a microstructured modular reactor for parallel gas phase catalyst screening
A. Müller, K. Drese, H. Gnaser, M. Hampe, V. Hessel, H. Löwe, S. Schmitt, R. Zapf
Catalysis Today 81 (2003) 377-391
https://doi.org/10.1016/S0920-5861(03)00136-6

Detailed characterization of various porous alumina-based catalyst coatings within microchannels and their testing for methanol stream reforming
R. Zapf, C. Becker-Willinger, K. Berresheim, H. Bolz, H. Gnaser, V. Hessel, G. Kolb, P. Löb, A.-K. Pannwitt, A. Ziogas
Chem. Engin. Res. Design 81 (2003) 721
https://doi.org/10.1205/026387603322302887

Characterization of nanocrystalline anatase TiO₂ thin films
B. Huber, H. Gnaser, C. Ziegler
Anal. Bioanal. Chem. 375 (2003) 917-923
https://doi.org/10.1007/s00216-003-1800-x

Formation of tantalum nitride films by rapid thermal processing
C. Angelkort, A. Berendes, H. Lewalter, W. Bock, B.O. Kolbesen
Thin Solid Films 437 (2003) 108-115
https://doi.org/10.1016/S0040-6090(03)00603-5

A „combinatorial“ approach to the design of a screening reactor for parallel gas phase catalyst screening
A. Müller, K. Drese, H. Gnaser, M. Hampe, V. Hessel, H. Löwe, S. Schmitt, R. Zapf
Chemistry Today 9/2003 (2003) 60-66

Surface and thin-film analysis by mass spectrometry
H. Gnaser
In Recent Research Developments in Vacuum Science & Technology, ed., S.G. Pandalai (Transworld Research Network, Kerala, 2003) 111-142

Detailed X-ray diffraction studies on optically pumped mid-infrared W-lasers
G. Hoffmann, H.J. Schimper, C. Schwender, N. Herhammer, G.F. West, B. Vogelgesang, J.O. Drumm, H. Fouckhardt, M. Scheib
J. Cryst. Growth 257 (2003) 42-50
https://doi.org/10.1016/S0022-0248(03)01387-3

X-ray study of interface stoichiometry and electronic properties of optically pumped antimonide-based mid-infrared W-laser structures
G. Hoffmann, C. Schwender, B. Vogelgesang, H.J. Schimper, J.O. Drumm, N. Herhammer, G.F. West, H. Fouckhardt and M. Scheib
IEE Proceedings-Optoelectronics, Vol. 150, No. 4 (2003) 403-408
https://doi.org/10.1049/ip-opt:20030484

Optical and mechanical characteristics of nanocrystalline boron carbonitride films synthesized by plasma-assisted physical vapor deposition
Z.X. Cao, H. Oechsner
J. Appl. Phys. A 93 (2003) 1186-1189
https://doi.org/10.1063/1.1529990

On the influence of substrate temperature for cubic boron nitride growth
Y.K. Le, H. Oechsner
Thin Solid Films 437 (2003) 83-88
https://doi.org/10.1016/S0040-6090(03)00686-2

Nature of infrared-active phonon sidebands to internal vibrations: Spectroscopic studies of solid oxygen and nitrogen
A. P. Brodyanski, S. A. Medvedev, M. Vetter, J. Kreutz, H. J. Jodl
Physical Review B 66 (2002) 104301
https://doi.org/10.1103/PhysRevB.66.104301

Plasma assisted deposition of nanocrystalline BCN thin films and property characterization
Z.X. Cao, L.M. Liu, H. Oechsner
JVST B. 20 (2002) 2275-2280
https://doi.org/10.1116/1.1518973

Molecular anions sputtered from fluorides
H. Gnaser
Nucl. Instrum. Methods B 197 (2002) 49
https://doi.org/10.1016/S0168-583X(02)01468-4

Discovery of a new class of stable gas-phase dianions: Mixed oxygen-carbon cluster CO_n^2- (n=5-19)
H. Gnaser, A. Dreuw, L.S. Cederbaum
Journal of Chemical Physics 117 (2002) 7002-7009
https://doi.org/10.1063/1.1506908

Formation of gas-phase oxygen-carbon OC_n^2- dianions by sputtering
H. Gnaser
Physical Review A 66 (2002) 013203-1 – 013203-4
https://doi.org/10.1103/PhysRevA.66.013203

Formation of niobium nitride by rapid thermal processing
C. Angelkort, H. Lewalter, P. Warbichler, F. Hofer, W. Bock, B.O. Kolbesen
Spectrochimica Acta Part A (2001) 2077-2089
https://doi.org/10.1016/S1386-1425(01)00490-5

Ionization probability of sputtered negative cluster ions: Dependence on surface work function and emission velocity
H. Gnaser
Physical Review B 63 (2001) 045415-1 – 045415-7
https://doi.org/10.1103/PhysRevB.63.045415

Comparative study of the epitaxial growth of Cu on MgO(001) and on hydrogen terminated Si(001)
T. Mewes, M. Rickart, A. Mougin, S.O. Demokritov, J. Fassbender, B. Hillebrands, M. Scheib
Surface Science 481 (2001) 87-96
https://doi.org/10.1016/S0039-6028(01)01000-7

Comparative determination of the electron temperature in Ar- and N₂-plasmas with electrostatic probes, optical emission spectroscopy OES and energy dispersive mass spectrometry EDMS
G. Crolly, H. Oechsner
European Physical Journal of Applied Physics 15 (2001) 49-56
https://doi.org/10.1051/epjap:2001166

Characterization of sputter deposited cBN-films by low energy electron loss spectroscopy LEELS
H. Oechsner, S. Westermeyr, J. Ye
Applied Surface Science 179 (2001) 88-94
https://doi.org/10.1016/S0169-4332(01)00268-9

Greatly enhanced detection sensitivity for carbon, nitrogen, and oxygen in silicon by secondary-ion-mass spectrometry
H. Gnaser
Applied Physics Letters 79 (2001) 497-499
https://doi.org/10.1063/1.1388876

Optical and structural characterization of erbium-doped TiO₂ xerogel films processed on porous anodic alumina
N.V. Gaponenko, O.V. Sergeev, E.A. Stepanova, V.M. Parkun, A.V. Mudryi, H. Gnaser, J. Misiewicz, R. Heiderhoff, L.J. Balk, G.E. Thompson
Journal of The Electrochemical Society 148 (2) (2001) H13-H16
http://dx.doi.org/10.1149/1.1339864

Effect of substrate temperature and ion bombardment on the formation of cubic boron nitride films: A two-step deposition approach
J. Ye, H. Oechsner, S. Westermeyr
J. Vac. Sci. Technol. A 19 (5) (2001) 2294-2300
http://dx.doi.org/10.1116/1.1384561

Theoretical and experimental characterization of a low-pressure rf plasma and its optimization in electron-gas secondary-neutral mass spectrometry
W. Bieck, E. Merz, H. Gnaser, H. Oechsner
J. Vac. Sci. Technol. A 19 (1) (2001) 108-117
https://doi.org/10.1116/1.1329117

Optimization strategy of the spinning process
S. Nzahumunyurwa, H.-J. Hoffmann, H. Oechsner, J. Disam
Mat.-Wiss.u. Werkstofftech. 32 (2001) 827-836
http://dx.doi.org/10.1002/1521-4052(200111)32:113.0.CO;2-3

Is the nucleation and coalescence behaviour in the growth of a-Si:H films prepared by the CAT-CVD different?
R.O. Dusane , S. Bauer, B. Schröder, H. Oechsner
Thin Solid Films 395 (2001) 121-124
https://doi.org/10.1016/S0040-6090(01)01228-7

Detection of nitrogen in silicon in the low ppb-range
H. Gnaser
In Secondary Ion Mass Spectrometry SIMS XII, eds. A. Benninghoven, P. Bertrand, H.N. Migeon, H.W. Werner (Elsevier, Amsterdam (2000)) p. 413

MCs_n⁺ (n=1,2,3) molecular ion emission from the Si/SiO₂ system
W. Bieck, H. Gnaser
In Secondary Ion Mass Spectrometry SIMS XII, eds. A. Benninghoven, P. Bertrand, H.N. Migeon, H.W. Werner (Elsevier, Amsterdam (2000)) p. 119

Characterization of thin films by surface mass spectrometry
H. Gnaser
In Thin Film Physics and Applications, eds. J. Chu, P. Liu, Y. Chang, Proc. SPIE, Vol. 4086 (SPIE, Bellingham (2000)) p. 7

On the formation of concentration profiles by low-energy ion bombardment and sputter depth profiling
Z. Cao, H. Oechsner
Nuclear Instruments and Methods in Physics Research B 170 (2000) 53-61
https://doi.org/10.1016/S0168-583X(00)00069-0

Concentration microprofiles in iron silicides induced by low energy Ar⁺ ion bombardment
Z. Cao, H. Oechsner
Nuclear Instruments and Methods in Physics Research B 168 (2000) 192-202
https://doi.org/10.1016/S0168-583X(99)00875-7

Quantitative sputter depth profiling of silicon- and aluminium oxynitride films
S. Dreer, P. Wilhartitz, K. Piplits, H. Hutter, M. Kopnarski, G. Friedbacher
Mikrochim. Acta 133 (2000) 75-87

INA-X: An advanced instrument for electron-gas SNMS
H. Oechsner, W. Bock, M. Kopnarski, M. Müller
Mikrochim. Acta 133 (2000) 69-73

Application of microbeam techniques to materials problems in a service laboratory
M. Kopnarski
Mikrochim. Acta 132 (2000) 401-410

Compositional and structural characterization of temperature-induced solid-state reactions in Al/Ni multilayers
U. Rothhaar, H. Oechsner, M. Scheib, R. Müller
Physical Review B 61 (2000) 974-979
https://doi.org/10.1103/PhysRevB.61.974

Comparative analysis of a solar control coating on glass by AES, EPMA, SNMS and SIMS
M. Pidun, N. Lesch, S. Richter, P. Karduck, W. Bock, M. Kopnarski, P. Willich
Mikrochim. Acta 132 (2000) 429-434

On the splitting of SiH absorption bands in infrared spectra of hydrogenated microcrystalline silicon
D. Stryahilev, F. Diehl, B. Schröder, M. Scheib, A.I. Belogorokhov
Philosophical Magazine B 80 (2000) 1799-1810
http://dx.doi.org/10.1080/13642810008216507

Growth and magnetic properties of Fe films on vicinal to (001) substrates
A.R. Frank, J. Jorzick, M. Rickart, M. Bauer, J. Fassbender, S.O. Demokritov and B. Hillebrands, M. Scheib, A. Keen, A. Petukhov, A. Kirilyuk, Th. Rasing
Journal of Applied Physics 87 (2000) 6092-6094
https://doi.org/10.1063/1.372619

Negative cluster ions in sputtering of Si, SiC and graphite: Abundance distributions, energy spectra and fragmentation processes
H. Gnaser
Nuclear Instruments and Methods in Physics Research B 164-165 (2000) 705-714
https://doi.org/10.1016/S0168-583X(99)01116-7

Ionization probability of sputtered clusters
R. Heinrich, C. Staudt, M. Wahl, A. Wucher
Proceedings of the 12^th International Conference on Secondary Ion Mass Spectrometry, Brussels, Belgium (5-11 September 1999) 111-114

Doubly charged negative silicon-carbon clusters produced in sputtering
H. Gnaser
Physical Review A 60 (1999) R2645-R2648
https://doi.org/10.1103/PhysRevA.60.R2645

Energy spectra of sputtered species under sub-keV ion bombardment: experiments and computer simulations
T. Mousel, W. Eckstein, H. Gnaser
Nuclear Instruments and Methods in Physics Research B 152 (1999) 36-48
https://doi.org/10.1016/S0168-583X(98)00976-8

Singly- and doubly-negative carbon clusters in sputtering: Energy spectra, abundance distributions and unimolecular fragmentation
H. Gnaser
Nuclear Instruments and Methods in Physics Research B 149 (1999) 38-52
https://doi.org/10.1016/S0168-583X(98)00756-3

Characterization of sputtered titanium silicide ohmic contacts on n-type 6H-silicon carbide
R. Getto, J. Freytag, M. Kopnarski, H. Oechsner
Materials Science and Engineering B 61-62 (1999) 270-274
https://doi.org/10.1016/S0921-5107(98)00516-9

Low-energy plasma beam deposition of carbon nitride layers with β-C₃-N₄-like fractions
F.-R. Weber, H. Oechsner
Thin Solid Films 355-356 (1999) 73-78
https://doi.org/10.1016/S0040-6090(99)00502-7

INA-X: A novel instrument for electron-gas secondary neutral mass spectrometry with optional in situ x-ray photoelectron spectroscopy
H. Oechsner, M. Müller
J. Vac. Sci. Technol. A 17 (6) (1999) 3401-3405
https://doi.org/10.1116/1.582073

Variation of carbon concentration, ion energy, and ion current density of magnetron-sputtered boron carbonitride films
S. Ulrich, A. Kratzsch, H. Leiste, M. Stüber, P. Schloßmacher, H. Holleck, J. Binder, D. Schild, S. Westermeyr, P. Becker, H. Oechsner
Surface and Coatings Technology 116-199 (1999) 742-750
https://doi.org/10.1016/S0257-8972(99)00353-9

Operation and application of a laser mass analyser (LASMA) for multielement analysis
D.M. Woll, M. Wahl, H. Oechsner
Fresenius J Anal Chem 365 (1999) 70-75

Analysis of electrically non-conducting sample structures with electron and mass spectroscopic methods
H.Oechsner
Thin Solid Films 341 (1999) 105-108
https://doi.org/10.1016/S0040-6090(98)01545-4

ECWR-plasma CVD as a novel technique for phase controlled deposition of semiconductor films
H. Oechsner, M. Scheib, H. Goebel
Thin Solid Films 341 (1999) 101-104
https://doi.org/10.1016/S0040-6090(98)01547-8

PECVD of cubic boron nitride with an ECWR-plasma and borane-ammonia (BH₃NH₃) as educt material
A. Schumacher, H. Oechsner
Le Vide 291 (1999) 106-109

Dept profile analysis with SNMS and GDOES
M. Kopnarski, J. Angeli
Steal Research, 69 (12): 489-495 DEC (1998)

Reference materials for composition-depth profiles of TiN, Ti(C,N) and (Ti,Al)N with different chemical composition
H.-R. Stock, A. Schulz, M. Kopnarski and T. Gross
Surface and Coatings Technology 98 (1998) 918-924

Enhanced optical absorption in hydrogenated microcrystalline silicon: An absorption model
F. Diehl, M. Scheib, B. Schröder, H. Oechsner
Journal of Non-Crystalline Solids 227-230 (1998) 973-977

Depth profiling of thin TiSix-films on silicon carbide by SNMS
R. Getto, J. Freytag, M. Kopnarski and H. Oechsner
Materials Science Forum 287-288 (1998) 231-234

Sputtering of Cs-carrying diatomic cations from surfaces by keV-Cs+ irradiation
H. Gnaser
International Journal of Mass Spectrometry and Ion Processes 174 (1998) 119-127

MCs+ ion emission from II-VI semiconductors: Yields and formation probabilities
H. Gnaser
In Secondary Ion Mass Spectrometry SIMS XI, eds. G. Gillen, R. Lareau, J. Bennet, F. Stevie (Wiley, Chichester) (1998) p. 915

Ion-yield and work-function changes during transient cesium incorporation
H. Gnaser
In Secondary Ion Mass Spectrometry SIMS XI, eds. G. Gillen, R. Lareau, J. Bennet, F. Stevie (Wiley, Chichester) (1998) p. 891

Spatially 3-dimensional SIMS analysis with MCs+ ions
H. Gnaser
In Secondary Ion Mass Spectrometry SIMS XI, eds. G. Gillen, R. Lareau, J. Bennet, F. Stevie (Wiley, Chichester) (1998) p. 827

Aluminium mediated low temperature growth of crystalline silicon by plasma-enhanced chemical vapor and sputter deposition
T.P. Drüsedau, J. Bläsing, H. Gnaser
Appl. Phys. Lett. 72 (1998) 1510-1512

Erbium photoluminescence in sol-gel derived titanium dioxide films
N.V. Gaponenko, O.V. Sergeev, J. Misiewicz, H. Gnaser, R. Heiderhoff, R.M. Cramer, L.J. Balk, A. Dunbar, B. Hamilton
In Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, eds. A. Rogalski, J. Rutkowski (SPIE, Washington (1998)) p. 239-242

Conditions for the formation of cubic boron nitride films by r.f. magnetron sputtering
J. Ye, U. Rothhaar, H. Oechnser
Surface and Coatings Technology 105 (1998) 159-164

Spannungsanisotropie und Struktur von TiN-Schichten
T. Conradi, F. Hubenthal, K. Röll, T. Stobiecki, K. Thoma, G. Berg, E. Broszeit, S. Bauer, W. Bock, M. Scheib, D. Wiescher und H. Oechsner
Mat.-wiss. u. Werkstofftechn. 29 (1998) 476-483

Niederenergie-IBAD: Zusammenhang zwischen Prozessparametern und Schichteigenschaften bei ionenstrahlunterstützten Aufdampf- und Sputtertechniken
H. Oechsner, M. Schaff, A. Schumacher and D. Wolff
Mat.-wiss. u. Werkstofftechn. 29 (1998) 466-475

On the use of SNMS for the manufacture control of Ag colloid containing sol-gel films on glass
W. Bock, B. Kutsch, M. Kopnarski and H. Oechsner
Materials Science Forum 287-288 (1998) 407-410

Interdiffusion studies of Cr2O3 layers on ceramic Al2O3 substrates
U. Rothhaar and H. Oechsner
Thin Solid Films 324 (1998) 165-169

Abundance and detection sensitivity in secondary-neutral mass spectrometry with electron-gas post-ionization
H. Gnaser, H.-J. Schneider and H. Oechsner
Nuclear Instruments and Methods in Physics Research B 136-138 (1998) 1023-1027

Process controlled microstructural and binding properties of hard physical vapor deposition films
H. Oechsner
J. Vac. Sci. Technol. A 16 (1998) 1956-1962

Sekundärneutralteilchen-Massenspektrometrie SNMS – derzeitiger Stand und weitere Entwicklungen
W. Bock, M. Kopnarski and H. Oechsner
Vakuum in Forschung und Praxis 1 (1998) 21-28

Phase separation in magnetron sputtered superhard BCN thin films
S. Ulrich, H. Ehrhardt, T. Theel, J. Schwan, S. Westermeyr, M. Scheib, P. Becker, H. Oechsner, G. Dollinger, A. Bergmaier
Diamond and Related Materials 7 (1998) 839-844

Light scattering and enhanced optical absorption in hot wire microcrystalline
F. Diehl, B. Schröder, H. Oechsner
J. Appl.Phys. 84 (1998), 3416-3419

The origin of enhanced optical absorption silicon in hot wire microcrystalline
F. Diehl, B. Schröder, H. Oechsner
Mat. Res Soc. Symp. Proc. 507 (1998), 819-824

The effect of hydrogen dilution on the microstructure and stability of a-Si:H-films prepared by different techniques
S. Bauer, B. Schröder, H. Oechsner
J. Non-Cryst. Solids, 227-230 (1998), 34-38

Die Deutsche Vakuumgsellschaft DVG- Eine Einrichtung zur Förderung der vakuumgestützten Wissenschaftsbereiche und deren Anwendungen
H. Oechsner
Vakuum in Forschung und Praxis 2 (1998), 105-109

Low temperature formation of β-silicon carbide
S. Ulrich, T. Teel, J. Schwan, V. Batori, M. Scheib, H. Ehrhardt
c 6 (1997) No. 5-7, 645

Formation of nanocrystalline diamond by hydrocarbon plasma beam deposition
S. Sattel, J. Robertson, Z. Tass, M. Scheib, D. Wiescher, H. Ehrhardt
Diamond and Related Materials 6 (1997) No. 2-4, 255

Stress-induced formation of high-density amorphous carbon thin films
J. Schwan, S. Ulrich, T. Theel, H. Roth, H. Ehrhardt, P. Becker, S.R.P. Silva
J. Appl. Phys. 82 (1997) 6024-6030

Comparative analysis of thin films by electron gas SNMS and MCs+-SIMS
W. Bock, H. Gnaser, H. Oechsner
In Secondary Ion Mass Spectrometry SIMS X, ed. A. Benninghoven et al (Wiley, Chichester) (1997) p. 335

Interface characterization of PICVD-coated polymer substrates
V. Rupertus, K. Berresheim, C. Ottermann, S. Thiel, M. Kopnarski, K. Bange
Fresenius J. Anal. Chem. 358 (1-2): 85-88 (1997)

Quantification of SIMS depth profiles using MCs+ secondary ions
H. Gnaser
In Secondary Ion Mass Spectrometry SIMS X, ed. A. Benninghoven et al (Wiley, Chichester) (1997) p. 335

MCs+ secondary ions: Formation mechanisms and dependence on oxygene pressure
J.M. Schroeer, H. Gnaser
In Secondary Ion Mass Spectrometry SIMS X, eds. A. Benninghoven et al (Wiley, Chichester) (1997) p. 271

Ion emission from Cs-implanted semiconductors: Correlations in Cs+ and MCs+ yields
H. Gnaser
In Secondary Ion Mass Spectrometry SIMS X, eds. A. Benninghoven et al (Wiley, Chichester) (1997) p. 207

3D analysis of solids using sputtered MCs+ions
H. Gnaser
Fresenius J. Anal. Chem. 358 (1997) 171-175

Approach for a three-dimensional on-chip quantification by secodary-ion mass spectrometry analysis
H. Gnaser
J. Vac. Sci. Technol. A 15 (1997) 445-451

SIMS detection in the 1012 atoms/cm3 range
H. Gnaser
Surface and Interface Analysis 25 (1997) 737-740

Formation of metastable N2- and CO- anions in sputtering
H. Gnaser
Physical Review A 56 (1997) R2518-R2521

Parts-per-billion detection with electron-gas secondary-neutral mass spectrometry
H. Gnaser, H. Oechsner and H.-J. Schneider
Applied Surface Science 120 (1997) 220-224

Chemical surface and thin film analysis in glass coating
H. Oechsner
Glastechn. Ber. Glass Sci. Technol. 70 (1997) 340-353

In situ STM and AES studies on the oxidation of Cr(110)
M. Müller and H. Oechsner
Surface Science 387 (1997) 269-278

Reibverhalten von PVD-Werkzeugbeschichtungen in der Blechumformung
G. Berg, C. Friedrich, E. Broszeit, K.-H. Kloos, J. Staeves, D. Schmoeckel, F.-R. Weber, H. Oechsner, A. Schulz, H.-R. Stock, P. Mayr
Bänder Bleche Rohre 5 (1997) 46-51

Low energy plasma beams for semiconductor technology
H. Oechsner
Plasma Processing of Semiconductors (1997) 529-544

Resonant plasma excitation by electron cyclotron waves – fundamentals and applications
H. Oechsner
Plasma Processing of Semiconductors (1997) 157-180

On the dynamic range in depth profiling with electron-gas SNMS
W. Bock, M. Kopnarski and H. Oechsner
Fresenius J. Anal. Chem. 358 (1997) 300-303

Temperature induced dissolution of Cr2O3 into polycrystalline tantalum
U. Rothhaar and H. Oechsner
Thin Solid Films 302 (1997) 266-269

An approach towards high efficiency hot-wire CVD based a-Si:H pin solar cells
S. Bauer, W. Herbst, B. Schroeder, H.Oechsner, W. Frammelsberger
Proc. 14th Europ. Photovoltaic Solar Energy Conf. (1997), 617

a-Si:H solar cells using the hot-wire technique-How to exceed efficiencies of 10%
S. Bauer, W. Herbst, B. Schröder, H. Oechsner
Proc.26th IEEE Photovoltaic Specialists Conf. (1997) 719-723

Mikrobereichsanalyse mit massenspektrometrischen Methoden
M. Kopnarski
Deutscher Verband für Materialforschung und –prüfung e.V. (1996) 99-105

Strong 1.54 µm luminescence from erbium-doped porous silicon
A. Dorofeev, E. Bachilo, V. Bondarenko, N. Gaponenko, N. Kazuchits, A. Leshok, G. Troyanova, N. Vorozov, V. Borisenko, H. Gnaser, W. Bock, P. Becker, H. Oechsner
Thin Solid Films 276 (1996) 171-174

Towards a 3D characterization of solids by MCs+ SIMS
H. Gnaser
Surface and Interface Analysis 24 (1996) 483-489

Initial stages of cesium incorporation on keV-Cs+-irradiated surfaces: Positive-ion emission and work-function changes
H. Gnaser
Physical Review B 54 (1996) 17141-17146

Exponential scaling of sputtered negative-ion yields with transient work-function changes on Cs+-bombarded surfaces
H. Gnaser
Physical Review B 54 (1996) 16456-16459

Deposition of nanocrystalline silicon films (nc-Si:H) from a pure ECWR-SiH4 plasma
M. Scheib, B. Schröder and H. Oechsner
Journal of Non-Crystalline Solids 198-200 (1996) 895-898

Time resolved analysis of ion motion in an oscillating plasma sheath
D. Martin and H. Oechsner
Vacuum 47 (1996) 1017-1022

Scanning work function microscopy
H. Oechsner
Fresenius J. Anal. Chem. 355 (1996) 419-424

Ion assisted growth of diamond
S. Sattel, J. Robertson, M. Scheib, H. Ehrhardt
Applied Physics Letters 69 (1996) 497

Temperature dependence of formation of highly tetrahedral a-C:H
S. Sattel, J. Robertson, T. Giessen, H. Roth, M. Scheib, R. Samlenski, R. Brenn, H. Ehrhardt
Diamond Films 95, Barcelona , Diamond and Related Materials 5 (1996) 425

Preparation of cubic boron nitride films by radio frequency magnetron sputtering and radio frequency ion plating
S. Ulrich, J. Scherer, J. Schwan, I. Barzen, K. Jung, M. Scheib, H. Ehrhardt
Applied Physics Letters 68 (1996) 909

Investigation of the amorphous to nanocrystalline phase transition at the deposition of silicon films in an ECWR plasma of pure SiH4
M. Scheib, B. Schröder, H. Oechsner
Materials Research Society Symposium Proceedings (MRS Spring Meeting in San Francisco 1996) Vol. 420, p. 437-442

Experimental studies of ionization processes in sputtering of GaAs
Z. Šroubek and H. Oechsner
Surface Science 348 (1996) 100-104

p-i interface engineering and I-layer control of hot-wire a-Si:H based p-i-n solar cells using in-situ ellipsometry
S. Bauer, R.O. Dusane, W. Herbst, F. Diehl, B. Schröder, H. Oechsner
Solar Energy Materials and Solar Cells, 43 (1996) 413-424

In situ ellipsometric studies of the growth of a-Si:H films prepared by the hot wire deposition
S. Bauer, R.O. Dusane, R. Biehl, B. Schröder, H. Oechsner
Materials Research Society, Symposium Proceedings Vol. 420: Amorphous Silicon Technology (1996) 425-430

Creation of metastable defects in a-Si:H by keV-electron irradiation at different temperatures
F. Diehl, W. Herbst, S. Bauer, B. Schröder, H. Oechsner
J. Non-Cryst. Sol. 198-200 (1996) 436-440

Some aspects on an improved stability of a-Si:H and a-Ge:H films with respect to their microstructure
S. Bauer, T. Haage, B. Schröder, H. Oechsner
J. Non-Cryst. Sol. 198-200 (1996) 462-465

Characterization of boron nitride films and of their behaviour under ion irradiation with Auger Electron Spectroscopy (AES)
S. Westermeyr, M. Haag, J. Ye and H. Oechsner
Wiley & Sons, Chichester (1996) 799-802

Carbon depth distribution in spin-on silicon dioxide films
N.V. Gaponenko, H. Gnaser, P. Becker, V.A. Grozhik
Thin Solid Films 261 (1995) 186-191

Correlations in secondary-ion yields from Cs-implanted semiconductors
H. Gnaser
Surface Science 342 (1995) 319-326

MPCVD diamond deposition on bias pretreated porous silicon
R. Spitzl, V. Raiko, R. Heiderhoff, H. Gnaser, J. Engemann
Diamond and Related Materials 4 (1995) 563

MCs+ secondary ion and sputtering yields of oxygen-exposed semiconductors and glasses
M. Haag, H. Gnaser and H. Oechsner
Fresenius J. Anal. Chem. 353 (1995) 565-569

Applications of work function microscopy in the onset mode
J. Scholtes
Fresenius J. Anal. Chem. 353 (1995) 499-505

Determination of diffusion induced concentration profiles in Cr2O3 films on ceramic Al2O3 by Auger sputter depth profiling
U. Rothhaar and H. Oechsner
Fresenius J. Anal. Chem. 353 (1995) 533-535

High resolution depth profiling of non-conducting samples with SNMS
W. Bock, M. Kopnarski, H. Oechsner
Fresenius J. Anal. Chem. 353 (1995) 510-513

Modelling the dielectric function of thin films measured by spectroscopic ellipsometry: determination of microstructure and density
T. Haage, U.I. Schmidt, B. Schröder and H. Oechsner
Fresenius J. Anal. Chem. 353 (1995) 556-558

Surface modification of GaAs(110) by low-energy ion irradiation
H. Gnaser, B. Heinz, W. Bock and H. Oechsner
Physical Review B 52 (1995) 14086-14092

Secondary neutral mass spectrometry
H. Oechsner
Surface Analysis (1995) 5014-5027

Analysis of solids with a secondary-neutral microprobe based on electron-gas post-ionization
W. Bieck, H. Gnaser and H. Oechsner
Fresenius J. Anal. Chem. 353 (1995) 324-328

Properties of carbon nitride layers generated by direct plasma beam deposition
F.-R. Weber and H. Oechsner
Surface and Coatings Technology 84-75 (1995) 704-709

Isotopic mass effects in low-energy sputtering of copper and molybdenum
W. Bieck, H. Gnaser and H. Oechsner
Nuclear Instruments and Methods in Physics Research B 101 (1995) 335-342

Secondary neutral mass spectrometry (SNMS)-recent methodical progress and applications to fundamental studies in particle/surface interaction
H. Oechsner
International Journal of Mass Spectrometry and Ion Processes 143 (1995) 271-282

Erbium luminescence in porous silicon doped from spin-on films
A.M. Dorofeev, N.V. Gaponenko, V.P. Bonarenkto, E.E. Bachilo, N.M. Kazuchits, A.A. Leshok, G.N. Troyanova, N.N. Vorosov and V.E. Borisenko, H. Gnaser, W. Bock, P. Becker and H. Oechsner
J. Appl. Phys. 77 (1995) 2679-2683

Focused-ion-beam implantation of Ga in elemental and compound semiconductors
H. Gnaser, C. Kallmayer and H. Oechsner
J. Vac. Sci. Technol. B 13 (1995) 19-26

Nucleation during deposition of hydrocarbon ions as a function of substrate temperature
S. Sattel, M. Weiler, J. Gerber, T. Giessen, H. Roth, M. Scheib, K. Jung, H. Ehrahrdt, J. Robertson
Diamond and Related Materials 4 (1995) 333

sp2 → sp3 phase transition induced by subplantation and stress in C- and BN-thin films
H. Ehrhardt, W. Dworschak, S. Ulrich, K. Jung, M. Scheib, M. WeilerAdvances in Science and Technology 6, New Diamond and Diamond-Like Films (1995) 191

A study on the influence of the spatial distribution of metastable defects on the properties of a-Si:H p-i-n and n-i-p solar cells: Experiment and numerical simulation
W. Herbst, J. Dudel, A. Scholz, B. Schröder, H. Oechsner
Solar Energy Materials and Solar Cells 37 (1995), 55-74

Secondary-neutral and secondary-ion mass spectrometry analysis of TiN-based hard coatings: an assessment of quantification procedures
W. Bock, H. Gnaser and H. Oechsner
Analytica Chimica Acta 297 (1994) 277-283

Density of glow discharge amorphous silicon films determined by spectroscopic ellipsometry
T. Haage, U.I. Schmidt, H. Fath, P. Hess, B. Schröder and H. Oechsner
J. Appl. Phys. 76 (1994) 4894-4896

Analytical performance of a secondary-neutral microprobe with electron-gas postionization and magnetic-sector mass spectrometer
W. Bieck, H. Gnaser and H. Oechsner
J. Vac. Sci. Technol. A 12 (1994) 2537-2543

Scanning Auger Microscopy
H. Oechsner
Le Vide 271 (1994) 141-150

Study of ionization processes in sputtering of LiF
Z. Šroubek and H. Oechsner
Surface Science 311 (1994) 263-268

Temperature dependence of the electron energy gap of high Tc superconductors studied by work function spectroscopy
S. Westermeyr, R. Müller, J. Scholtes and H. Oechsner
Appl. Phys. Lett. 64 (1994) 1726-1728

Emission of MCs+ secondary ions from semiconductors by caesium bombardment
H. Gnaser and H. Oechsner
Surface and Interface Analysis 21 (1994) 257-260

The influence of polarizability on the emission of sputtered molecular ions
H. Gnaser and H. Oechsner
Surface Science Letters 302 (1994) L289-L292

Improvement of grain size and deposition rate of microcrystalline silicon by use of very high frequency glow discharge
F. Finger, P. Hapke, M. Luysberg, R. Carius, H. Wagner, M. Scheib
Applied Physics Letters 65 (1994) 2588

Diamond nucleation during deposition of hydrocarbon ions
S. Sattel, M. Weiler, R. Samlenski, R. Brenn, M. Scheib, K. Jung, H. Ehrhardt, J. Robertson
Diamond Films Conference, Il Ciocco, Italy (1994)

Quantitative SIMS analysis utilizing MCs+ secondary ions
M. Haag, H. Gnaser, H. Oechsner
Proc. SIMS IX, John Wiley & Sons (1994), 390-393

The charge state of sputtered metal clusters
A. Wucher, M. Wahl, H. Oechsner
Proc. SIMS IX, John Wiley & Sons (1994), 100-103

Secondary Neutral Microprobes
H. Oechsner
Proc. SIMS IX, John Wiley & Sons (1994), 316-322

SIMS with MCs+ secondary ions: Relative yields and formation mechanisms
J.M. Schroeer, H. Gnaser, H. Oechsner
Proc. SIMS IX, John Wiley & Sons (1994), 386-389

A quantitative model of the metastable defect creation in amorphous semiconductors by keV-electron irradiation
A. Scholz, B. Schröder, H. Oechsner
MRS Conf. Proc. 336 (1994), 293-298

Effect of „soft start“ i-layer deposition on the performance and stability of a-Si:H p-i-n solar cells
W. Herbst, U.I. Schmidt, H. Schade, B. Schröder, H. Oechsner
Proc. 1994 IEEE 1st WCPEC Vol. I (1994), 479-482

Correlation between improved stability and microstructural properties of a-Si:H and a-Ge:H
H, T. Haage, S. Bauer, B. Schröder, H. Oechsner
Proc. 1994 IEEE 1st WCPEC Vol. I (1994), 429-432

In situ ellipsometric study of the dependence of a-Si:H film growth on substrate properties and ignition procedure
U.I. Schmidt, W. Herbst, B. Schröder, H. Oechsner
MRS Conf. Proc. 336 (1994), 085-090

Detection of sputtered metastable atoms by autoionisation
A. Wucher, W. Berthold, H. Oechsner, K. Franzreb
Phys. Rev. A49 (1994) 2188-2190

Light-induced annealing of keV-electron irradiated a-Si:H solar cells
W. Herbst, H. Schade, B. Schröder, H. Oechsner
Proceedings 12th ECPVSEC, Amsterdam 1994, 148-151

Recent instrumental developments in surface and thin-film analysis by electron and mass spectrometric techniques
H. Oechsner
Applied Surface Science 70/71 (1993) 250-260

Inorganic mass spectrometry for surface and thin film analysis
H. Oechsner
Analytica Chimica Acta 283 (1993) 131-138

Ein plasmagestütztes Hochfrequenzverfahren zum niederenergetischen Ionenbeschuss von Isolatorwerkstoffen, insbesondere von Gläsern
D. Martin und H. Oechsner
Vakuum in der Praxis 4 (1993) 263-268

Teilchenstrahlinduzierte Prozesse and dielektrischen Oberflächen
V. Rupertus, U. Rothhaar, P. Köpfer, A. Lorenz und H. Oechsner
Vakuum in der Praxis 3 (1993) 183-192

Direct plasma beam deposition of TiNx layers with an r.f. plasma beam source
F.R. Weber and H. Oechsner
Surface and Coatings Technology 59 (1993) 234-238

r.f. magnetron sputter deposition of Cr2O3 layers on ceramic Al2O3 substrates
U. Rothhaar and H. Oechsner
Surface and Coatings Technology 59 (1993) 183-186

A plasma-based technique for controlled low energy ion bombardment of dielectric surfaces
D. Martin and H. Oechsner
Surface and Coatings Technology 59 (1993) 239-243

A secondary-neutral microprobe with electron-gas postionization
W. Bieck, H. Gnaser and H. Oechsner
Appl. Phys. Lett. 63 (1993) 845-847

A search for doubly charged negative cluster ions in sputtering
H. Gnaser and H. Oechsner
Nuclear Instruments and Methods in Physics Research B 82 (1993) 518-521

Low-energy sputtering of small neutral clusters from alloys
H. Gnaser and H. Oechsner
Nuclear Instruments and Methods in Physics Research B 82 (1993) 347-351

Fluence dependent concentration of low-energy Ga implanted in Si
H. Gnaser, J. Steltmann and H. Oechsner
Nuclear Instruments and Methods in Physics Research B 80/81 (1993) 110-114

Yields and composition in low-energy sputtering of binary alloys: Experiments and computer simulations
H. Gnaser and H. Oechsner
Physical Review B 47 (1993) 14093-14102

Comparative SIMS and SNMS analyses of amorphous semiconductor thin films
H. Gnaser, W. Bock, H. Oechsner and T.K. Bhattacharayya
Applied Surface Science 70/71 (1993) 44-48

XPS- and AES-investigations of electron and ion beam induced effects on SK16 glass surfaces
U. Rothhaar, V. Rupertus and H. Oechsner
Fresenius J. Anal. Chem. 346 (1993) 96-98

Erprobung und Vergleich plasmadiagnostischer Methoden für Anwendungen in der Plasmaoberflächentechnik
G. Crolly, N. Krupp und H. Oechsner
Mat.-wiss. u. Werkstofftechn. 24 (1993) 91-101

Doping and alloying of hydrogenated amorphous germanium films prepared by DC-magnetron sputtering
T. Drüsedau, A. Annen, B. Schröder
MRS Symp. Proc. 297 (1993), 717-728

Photoconductivity spectroscopy (CPM) on a-Ge:H at low temperatures
A. Scholz, B. Müller, B. Schröder, H. Oechsner, H. Freistedt
J. Non-Cryst. Solids 164 (1993), 923-926

Influence of powder formation in a silane discharge on a-Si:H film growth monitored by in situ ellipsometry
U.I. Schmidt, B. Schröder and H. Oechsner
J. Non-Cryst. Solids 166 (1993), 127-130

Influence of the spatial distribution of metastable defects on the properties of degraded a-Si:H solar cells
W. Herbst, A. Scholz, B. Schröder, and H. Oechsner
Proc. 23rd IEEE PVSC (1993), 913-918

Entwicklung, Optimierung und Charakterisierung von Dünnschichtmaterialien und -strukturen sowie Grenzflächen für photovoltaische Anwendungen tetraedrisch gebundener Halbleiterschichten
H. Ehrhardt, H. Oechsner, H. Schmoranzer, B. Schröder, A. Annen, W. Dötter, T. Drüsedau, W. Dworschak, Ch. Eggs, R. Erz, W. Herbst, A. Jank, A. Mayer, P. Pa­padopulos, M. Semling, U. Schmidt, A. Scholz, J. Schwan
Statusreport 1993, Photovoltaik (ed. F. Stubenrauch, BEO, FZ Jülich, BMFT-Rep. 38 (1993), 1-19

The influence of oxygen incorporation to the properties of magnetron sputtered hydro­genated amorphous germanium films
B. Schröder, A. Annen, H. Freistedt, T. Drüsedau, P. Deak, and H. Oechsner
Appl. Phys. Letters 62 (1993), 1961-1963

In situ ellipsometric study of the influence of powder formation on the initial growth of glow discharge a-Si:H
U.I. Schmidt, B. Schröder and H. Oechsner
Thin Solid Films 233 (1993), 297-300

The mass distribution of sputtered metal clusters I. Experiment
A. Wucher, M. Wahl and H. Oechsner
Nucl. Instrum. Meth. Phys. Res. B83 (1993), 73-78

Characterization of the Fluxes of Neutral and Positively Charged Clusters (Agn+; n £ 4) Produced by Argon Ion Sputtering of Silver
K. Franzreb, A. Wucher, and H. Oechsner
Z. Phys. D 26 (1993), 101-103

Sputtered neutral silver clusters up to Ag18
A. Wucher, M. Wahl and H. Oechsner
Nucl. Instrum. Meth. Phys. Res. B82 (1993), 337-346

The saturation behaviour of metastable defect creation in a-Ge:H investigated by keV-electron irradiation
A. Scholz, B. Schröder and H. Oechsner
Proc. 23rd IEEE PVSC (1993), 907-912

Deposition of Device Quality a-Si:H Films with the Hot-Wire Technique
P. Papadopulos, A. Scholz, S. Bauer, B. Schröder and H. Oechsner
J. Non-Cryst. Solids 164 (1993), 87-90

Modification of crystalline semiconductor surfaces by low-energy Ar+ bombardment: Si(111) and Ge(100)
W. Bock, H. Gnaser and H. Oechsner
Surface Science 282 (1993) 333-341

Wurtzite CdSe grown by hot-wall epitaxy
M. Grün, U. Becker, M. Scheib, H. Giessen, G. Klingshirn
Journal of Crystal Growth 126 (1993) 505-509

Energy dependent studies of anisotropic atomic sputtering of Ni(111)
A. Wucher, M. Watgen, C. Mößner, H. Oechsner and B.J. Garrison
Nuclear Instruments and Methods in Physics Research B67 (1992) 531-535

Formation of neutral and positively charged clusters (Agand Ag ; n ≤ 4) during sputtering of silver
K. Franzreb, A. Wucher and H. Oechsner
Surface Science Letters 279 (1992) L225-L230

Compensational boron doping and determination of the mobility gap of a-Ge:H
T. Drüsedau, A. Annen, H. Freistedt, B. Schröder, and H. Oechsner
Phil. Mag. Letters 60 (1992), 175-179

Entwicklung einer Sekundärneutralteilchen-Mikrosonde
W. Bieck, M. Karr, J. Steltmann, H. Gnaser, H. Oechsner
Statusseminar 1992 Dünnschichttechnologien, VDI Verlag GmbH, Düsseldorf (1992), 759-767

Entwicklung und Erprobung einer kombinierten Mikrosondenapparatur zur Augerelek­tronen-, Austrittsarbeits- und Tunnelspektroskopie für die Oberflächen- und Dünn­schichtanalytik
J. Scholtes, M. Müller, H. Oechsner
Statusseminar 1992 Dünnschicht­technologien, VDI Verlag GmbH, Düsseldorf (1992), 750-758

Analytical Applicability and Formation of MCs+ Secondary Ions, H. Gnaser and H. Oechsner, in: Secondary Ion Mass Spectrometry, SIMS VIII, ed.
A. Benninghoven, K.T.F. Jansen, J. Tümpner, H.W. Werner
J. Wiley and Sons, Chichester, New York 1992), 95-98

Steuerung und Optimierung teilchenstrahlinduzierter Oberflächenprozessse an Isolator­werkstoffen, insbesondere an Gläsern
V. Rupertus, D. Martin, U. Rothhaar, A. Lorenz, H. Oechsner
Statusseminar 1992 Dünnschichttechnologien, VDI Verlag GmbH, Düsseldorf (1992), 791-799

Electron and mass spectrometric analysis of plasma controlled surfaces and thin films
H. Oechsner
Pure & Appl. Chem. 64 (1992) 615-622

Production of mixed metal-gas and pure metal ion beams with an electrodeless rf ion source in the low keV regime
J. Waldorf and H. Oechsner
Rev. Sci. Instrum. 63 (1992) 2578-2580

Hydrogen analysis by secondary ion mass spectrometry using HCs+ ions
H. Gnaser and H. Oechsner
Nuclear Instruments and Methods in Physics Research B 64 (1992) 646-649

Secondary neutral mass spectrometry (SNMS)
H. Oechsner
Analysis of Microelectronic Materials and Device (1991) 493-511

High dose, low energy implantation of nitrogen in silicon, niobium and aluminium
H.-J. Füßer and H. Oechsner
Surface and Coatings Technology 48 (1991) 97-102

Correlation between structural and photoelectrical properties of a-Si1-xGex:H alloy films – new interpretation concerning the preferential attachment of hydrogen
B. Schröder, M. Leidner and H. Oechsner
Mat. Res. Soc. Symp. Proc. 219 (1991) 277-282

Self-pulsing emission of a liquid metal ion source
F. Werner, H. Gnaser, J. Scholtes and H. Oechsner
J. Vac. Sci. Technol. A 9 (1991) 2678-2682

Angle-integrated yields of neutral clusters in low-energy sputtering of nickel and copper
H. Gnaser and H. Oechsner
Surface Science 251/252 (1991) 696-700

Saturation and fragmentation in non resonant laser postionization of sputtered atoms and molecules
K. Franzreb, A. Wucher and H. Oechsner
Fresenius J. Anal. Chem. 341 (1991) 7-11

SIMS depth profile analysis using MCs+ molecular ions
H. Gnaser and H. Oechsner
Fresenius J. Anal. Chem. 341 (1991) 54-56

Novel detection scheme for the analysis of hydrogen and helium by Secondary Ion Mass Spetrometry
H. Gnaser and H. Oechsner
Surface and Interface Analysis 17 (1991) 646-649

Formation of intrinsic oxide layers by ion implantation of silicon and titanium in the low kiloelectronvolt regime
H. Oechsner and J. Waldorf
Materials Science and Engineering A 139 (1991) 214-219

Emission-angle integrated yields of neutral clusters in sub-keV-energy sputtering
H. Gnaser and H. Oechsner
Nuclear Instruments and Methods in Physics Research B 58 (1991) 438-442

Investigation of hard a-C:H layers generated by a novel r.f. plasma beam source
H. Oechsner and B. Tomik
Surface and Coatings Technology 47 (1991) 162-172

Formation of secondary cluster ions during sputtering of silver and copper
K. Franzreb, A. Wucher and H. Oechsner
Physical Review B 43 (1991) 14396-14399

Plasma beam deposition of diamond-like films
J. Kessler, B. Tomcik, J. Waldorf and H. Oechsner
Vacuum 42 (1991) 273-277

Effective nitrogen doping of a-Ge:H-films prepared by DC-magnetron sputtering
T. Drüsedau, B. Schröder, H. Oechsner
Solid State Commun. 79 (1991), 799-801

Cross section measurements for electron-impact ionization of transition-element atoms
M. Kopnarski, H. Oechsner, T. Halden
Proc.XVII Int. Conf. on the Physics of Electronic and Atomic Collisions, Brisbane (Australien), ed.I.E. Mc Carthy et al (1991), 176

Formation of secondary cluster ions during sputtering of silver and copper
K. Franzreb, A. Wucher and H. Oechsner
Phys. Rev. B43 (1991), 396-399

Theoretical thermochemistry of diamond-like carbon film growth
P. Deak, J. Giber, H. Oechsner
Surf. Coat. Technol. 47 (1991), 517-521

Absolute cross sections for electron impact ionization of Ag2
K. Franzreb, A. Wucher and H. Oechsner
Z. Phys. D – Atoms, Molecules and Clusters 19 (1991) 77-79

Preparation and characterization of boron doped a-SiC:H films by dc-magnetron sputtering technique
S. Uthanna, B. Schröder and H. Oechsner
Vacuum 42 (1991) 287-290

Compositional and structural studies of ion beam deposited high-Tc oxide films by SNMS and REM
C. Mößner and H. Oechsner
Vacuum 42 (1991) 291-296

Secondary neutral mass spectrometric investigations on the formation of sputter-generated molecules by atomic combination
H. Oechsner
International Journal of Mass Spectrometry and Ion Processes 103 (1990) 31-43

Isotopic mass effects in sputtering: Dependence of fluence and emission angle
H. Gnaser and H. Oechsner
Nuclear Instruments and Methods in Physics Research B 48 (1990) 544-548

Dünnschichtsolarzellen aus gesputterten amorphen Silizium- und Siliziumlegierungen
B. Schröder, U. Schneider, J. Sopka, R. Hopp, M. Leidner, S. Uthanna, N. Serin, H. Oechsner
Statusbericht Photovoltaik (1990), 24/ 1-15

Steuerung und Optimierung teilchenstrahlinduzierter Oberflächenprozessse an Isolator­werkstoffen, insbesondere an Gläsern
H. Oechsner, V. Rupertus, D. Martin, H. Goebel, P. Köpfer, A. Lorenz, U. Rothhaar
Statusseminar 1990 Dünnschichttechnologien, VDI Verlag GmbH, Düsseldorf (1990), 144-159

Entwicklung einer Neutralteilchen-Mikrosonde
W. Bieck, H. Gnaser, H. Oechsner
Statusseminar 1990 Dünnschichttechnologien, VDI Verlag GmbH, Düsseldorf (1990), 102-112

Ionen- und plasmastrahlunterstützte Dünnschichtdeposition
H. Oechsner
Proc. of Coat Tech 89, (DEMAT Verlag Frankfurt 1990), 597-615

Compositional transients in the sputtered neutral particle flux
H. Gnaser and H. Oechsner
Secondary Ion Mass Spectrometry SIMS VII, ed. A. Benninghoven, C.A. Evans, K.D. McKeegan, H.A. Storms, H.W. Werner (J. Wiley and Sons, Chichester, New York 1990), 29-33

Electron Impact Ionization of Small Silver and Copper Clusters
K. Franzreb, A. Wucher and H. Oechsner
Z. Phys. D 17 (1990), 51-53

Entwicklung und Erprobung einer kombinierten Mikrosondenapparatur zur Augerelek­tronen-, Austrittsarbeits- und Tunnelspektroskopie für die Oberflächen- und Dünnschichtanalytik
J. Scholtes, M. Müller, H. Oechsner
Statusseminar 1990 Dünnschichttechnologien, VDI Verlag GmbH, Düsseldorf (1990), 89-101

Electron impact ionization of small silver and copper clusters
K. Franzreb, A. Wucher and H. Oechsner
Z. Phys. D – Atoms, Molecules and Clusters 17 (1990) 51-56

The influence of the film-substrate interface on the defect density and other properties of sputter-deposited amorphous hydrogenated silicon
J. Sopka, U. Schneider, B. Schröder, M. Favre, F. Finger, H. Oechsner
IEEE Transactions on Electron Devices 36 (1989) 2848-2852

Compositional transients in the sputtered neutral particle flux
H. Gnaser and H. Oechsner
Proc. SIMS VII (1990) 29-32

Determination of hydrogen concentration depth profiles in a-Si:H by secondary neutral mass spectrometry (SNMS)
J. Sopka and H. Oechsner
Journal of Non-Crystalline Solids 114 (1989) 208-210

Preferential sputtering of isotopes: Fluence and emission-angle dependence
H. Gnaser and H. Oechsner
Physical Review Letters 63 (1989) 2673-2676

Surface and depth profile analysis of insulator materials
H. Oechsner
Sonderdruck aus “Oberflächentechnik”, Vortrag des 5. SURTEC-Kongresses (1989)

Analysis of insulator samples by secondary neutral mass spectrometry
H. Oechnser
Scanning Microscopy 3 (1989) 411-418

Ion and plasma beam assisted thin film deposition
H. Oechsner
Thin Solid Films 175 (1989) 119-127

Elemental analysis of surfaces and thin films
K.-H. Müller
Thin Solid Films 174 (1989) 117-132

Absolute depth profiling of thin film systems by low energy secondary neutral mass spectrometry
A. Wucher, H. Oechsner and F. Novak
Thin Solid Films 174 (1989) 133-137

Generation of surface layers and microstructures with a low energy plasma beam source
J. Waldorf, H. Oechsner, H.-J. Füßer and J. Mathuni
Thin Solid Films 174 (1989) 39-44

Correlation between the structural and the electronic transport porperties of sputtered hydrogenated amorphous germanium films
D. Martin, B. Schröder, M. Leidner, H. Oechsner
J. Non-Crystalline Solids 114 (1989), 537-539

Characterization of ion-beam- and magnetron-sputtered YBa2Cu3O7-x high Tc superconducting films by secondary neutral mass spectrometry depth profiling
C. Mößner, K.-D. Ufert, P. Köpfer, V. Rupertus and H. Oechsner
Thin Solid Films 174 (1989) 255-262

Work function spectroscopy as a tool for thin film analysis
G. Bachmann, W. Berthold and H. Oechsner
Thin Solid Films 174 (1989) 149-154

Characterization of low pressure high frequency plasma by DC probe measurements
K. Franzreb, A. Fuchs, H. Oechsner
Plasma Surface Engineering, ed. E. Broszeit, W.D. Münz, H. Oechsner, K.T. Rie, G.K. Wolf, (DGM-Verlag Oberursel 1989), 99-105

Recent progress in surface and thin film analysis
H. Oechsner
Plasma Surface Engineering, ed. E. Broszeit, W.D. Münz, H. Oechsner, K.T. Rie, G.K. Wolf, (DGM-Verlag, Oberursel 1989), 705-720

Calibration of SNMS depth profile analysis
A. Wucher and H. Oechsner
Plasma Surface Engineering, ed. E. Broszeit, W.D. Münz, H. Oechsner, K.T. Rie, G.K. Wolf, (DGM-Verlag Oberursel 1989), 737-738

An RF plasma beam source for thin film and surface technology
H. Oechsner, H.J. Füßer, J. Waldorf, A. Fuchs
Plasma Surface Engineering, ed. E. Broszeit, W.D. Münz, H. Oechsner, K.T. Rie, G.K. Wolf, (DGM-Verlag Oberursel 1989), 1017-1025

A high current ion source for line shaped ion beams of inert or reactive gases and metals
H.J. Füßer, H. Oechsner
Plasma Surface Engineering, ed. E. Broszeit, W.D. Münz, H. Oechsner, K.T. Rie, G.K. Wolf, (DGM-Verlag Oberursel 1989), 1033-1040

Wege zu neuen Werkstoffen
H. Oechsner
IHK-Magazin 8/89, 10-11

Surface and Depth Profile Analysis of Insulator Materials
H. Oechsner
Proc. 5th SURTEC, Berlin 1989, (Hanser Verlag München), 485-492

A Newly Developed Linear Ion Implanter for Industrial Applications
F. Körber, W. D. Münz, H. Ranke, St. Reineck, H.J. Füsser and H. Oechsner
Mat. Sci. Eng. A116 (1989), 205-208

Depth scale calibration during sputter removal of multilayer systems by SNMS
A. Wucher and H. Oechsner
Fresenius Z. Anal. Chem. 333 (1989) 470-473

On the role of ion bombardment parameters in AES sputter depth profiling of Ta2O5 /Ta with Ar+ and Xe+
J. Scholtes and H. Oechsner
Fresenius Z. Anal. Chem. 333 (1989) 474-477

Analysis of sputter deposited and evaporated tantalum oxide layers on SiO2 by SNMS, XPS, TDS and TRFA
K.-H. Müller, V. Rupertus, H. Oechsner, V. Scheuer and T. Tschudi
Fresenius Z. Anal. Chem. 333 (1989) 498-501

Reactions of YBa2Cu3O7-x thin films on silicon substrates
M. Scheib, H. Göbel, L. Hofmann, B. Lengeler, H. Oechsner, G. Zorn
Thin Solid Films 174 (1989) 5-9

Emission energy dependence of ionization probabilities in secondary ion emission from oxygen covered Ta, Nb and Cu surfaces
A. Wucher and H. Oechsner
Surface Science 199 (1988) 567-578

Energy Dependent Ionization Probabilities for Atomic Secondary Ions
A. Wucher, H. Oechsner
Secondary Ion Mass Spectrometry SIMS VI, ed. A. Benninghoven, A.M. Huber, H.W. Werner (J. Wiley and Sons, Chichester New York 1988), 143-146

Analysis of Insulators by Secondary Neutral Mass Spectrometry
K.-H. Müller, M. Kopnarski, J.F. Geiger, H. Oechsner
Secondary Ion Mass Spectrometry SIMS IV, ed. A. Benninghoven, A.M. Huber, H.W. Werner (J. Wiley and Sons, Chichester New York 1988), 213-217

Quantitation of Molecular SNMS signals
M. Kopnarski, A. Wucher, K.-H. Müller, H. Oechsner
Secondary Ion Mass Spectrometry SIMS VI, ed. A. Benninghoven, A.M. Huber, H.W. Werner (J. Wiley and Sons, Chichcester New York 1988), 849-852

Some Aspects on the Saturation Level and the Origin of Metastable Defects in a-Si:H
U. Schneider, J. Sopka, B. Schröder, H. Oechsner
Proc. 20th IEEE Photovoltaic Specialists Conference (1988), 346-351

Recent applications of secondary neutral mass spectrometry for quantitative analysis of homogeneous and structured samples
H. Oechsner
Nuclear Instruments and Methods in Physics Research B 33 (1988) 918-925

Materials analysis by mass spectrometry of sputtered neutrals
H. Oechsner
Scanning Microscopy 2 (1988) 9-19

Energy distributions of metal atoms and monoxide molecules sputtered from oxidized Ta and Nb
A. Wucher and H. Oechsner
Nuclear Instruments and Methods in Physics Research B 18 (1987) 458-463

Energy distributions of neutral atoms sputtered from Cu, V and Nb under different bombardment and ejection angles
J. Dembowski, H. Oechsner, Y. Yamamura and M. Urbassek
Nuclear Instruments and Methods in Physics Research B 18 (1987) 464-470

Angular distributions of sputtered atoms from ion-bombarded surfaces
Y. Yamamura, C. Mößner and H. Oechsner
Radiation Effects 105 (1987) 31-41

SNMS-analysis of insulators
J.F. Geiger, M. Kopnarski, H. Oechsner and H. Paulus
Mikrochim. Acta I (1987) 497-506

The bombarding-angle dependence of sputtering yields under various surface conditions
Y. Yamamura, C. Mößner and H. Oechsner
Radiation Effects 103 (1987) 25-43

Application of work function measurements to the characterization of thin films and solid surfaces
G. Bachmann, J. Scholtes and H. Oechsner
Mikrochim. Acta I (1987) 489-496

Chemische Charakterisierung von Oberflächenschichten mit elektronen- und massen­spektrometrischen Methoden
H. Oechsner
Hartstoffschichten zur Verschleißminderung, ed. H. Fischmeister, H. Jehn (DGM Verlag, Oberursel 1987), 211-213

SNMS-Analysis of Insulators and Insulating Layer Structures
J.F. Geiger, H. Oechsner, H. Paulus
Proc. 6th Intern. Conf. Ion & Plasma Assisted Techniques, Brighton 1987, (CEP Edinburgh 1987), 390-395

Recent progress in high resolution depth profiling and interface analysis of thin films
H. Oechsner
Vacuum 37 (10) (1987) 763-768

The Bombarding Angle Dependence of Sputtering Yields under Various Surface Con­ditions
Y. Yamamura, C. Mössner and H. Oechsner
Radiation Effects 103 (1987), 25-54

Surface analysis by work function measurements in a Scanning Auger Microprobe
G. Bachmann, H. Oechsner and J. Scholtes
Fresenius Z. Anal. Chem. 329 (1987) 195-200

Analysis of thin films for industrial applications with a Scanning Auger Microprobe
G. Bachmann, H. Oechsner and J. Scholtes
Fresenius Z. Anal. Chem. 329 (1987) 190-194

Untersuchungen zur Korrosion durch Kunststoffschmelzen an verschiedenen wärmebehandelten Werkzeugstählen mittels ESCA, AES und SIMS
G. Bachmann, D. Braun, H. Brito, H. Oechsner und H. Schmiedel
Fresenius Z. Anal. Chem. 329 (1987) 311-322

Absolute Ionization Probabilites in Secondary Ion Emission from Clean Metal Surfaces
A. Wucher and H. Oechsner
ed. A.D. Romig Jr. and W.F. Chambers, San Francisco Press., 79-81

A Comparison of SNMS, RBS and AES for Quantitative Depth Profiling of Micro­scopically Modulated Thin Films
H. Oechsner, G. Bachmann, P. Beckmann and M. Kopnarski; D.A. Reed, S.M. Baumann, S.D. Wilson and C.A. Evans Jr.
Springer Ser. in Chemical Physics 44 (1986), 371-373

Electron Gas SNMS
H. Oechsner
Springer Ser. in Chemical Physics 44 (1986), 70-74

High resolution sputter depth profiling of implantation structures in Si by low energy SNMS
H. Oechsner, H. Paulus and P. Beckmann
J. Vac. Sci. Technol. A 3 (1985) 1403-1407

Secondary neutral mass spectrometry, Depth profile analysis of silicides
P. Beckmann, M. Kopnarski and H. Oechsner

Phase transition and oxide dissolution processes in vacuum-annealed anodic Nb2O5 /Nb systems
H. Oechsner, J. Giber, H.J. Füßer and A. Darlinski
Thin Solid Films 124 (1985) 199-210

Quantitative characterization of alloys and non-elemental semi-conductors by secondary neutral mass spectrometry (SNMS)
H. Oechsner
Proceedings II of the 6th International Symposium “High-Purity Materials in Science and Technology” Dresden, GDR, May 6-10, (1985) 180-193

Dissolution of anodic Ta2O5 layers into polycrystalline tantalum
J. Giber and H. Oechsner
Thin Solid Films 131 (1985) 279-287

SNMS-Depth Profile Analysis of Silicides
P. Beckmann, M. Kopnarski and H. Oechsner
Mikrochim. Acta Suppl. 11 (1985), 79-88

Formation of Sputtered Molecules
H. Oechsner
The Physics of Ionized Gases (SPIG 84), ed. by M.M. Popovic and P. Krstic, (World Scientific Publ., Singapore, Philadelphia, 1985), 571-598

Quantitative depth profile analysis by secondary neutral mass spectrometry (SNMS)
H. Oechsner
Proceedings of the 4th International Conference “Secondary Ion Mass Spectrometry (SIMS)”, Osaka, Japan, November 13-19, 1983 Editors: A. Benninghoven, J. Okano, R. Shimizu and H.W. Werner, Springer-Verlag (1984)

Thin film and depth profile analysis (Volume 37)
H. Oechsner (Editor)
Reprint from: Topics in Current Physics, Springer-Verlag (1984)

Bestimmung von Implanationsprofilen für As und P in Si mittels SNMS niedriger Energie
P. Beckmann, H. Oechsner, H. Paulus
Fresenius Z. Anal. Chem. 319 (1984), 851-852

Einfluß der Probentemperatur auf ionenbeschußinduzierte Konzentrationsmikroprofile in einer NiW-Probe
J. Bartella und H. Oechsner
Z. Anal. Chem. 319 (1984), 729-730

High Resolution Sputter Depth Profiling of Solid Interfaces and Thin Film Structures
H. Oechsner
Festkörperprobleme/Adv. Solid State Phys. XXIV (1984), 269-289

Identification of Atomically Sharp Concentration Steps in Solids
H. Oechsner
Fresenius Z. Anal.Chem. 319 (1984), 784-785

Quantitative Secondary Neutral Mass Spectrometry Analysis of Alloys and Oxide-Metal-Interfaces
K.H. Müller and H. Oechsner
Mikrochimica Acta, Suppl. 10 (1983) 51-60

The formation of Ta+ secondary ions at oxygen-covered Ta surfaces
H. Oechsner and Z. Sroubek
Surface Science 127 (1983) 10-20

Stoichiometry effects at NiMo surfaces under bombardment with Ar+ ions from 40 to 2000 eV
J. Bartella and H. Oechsner
Surface Science 126 (1983) 581-588

Analysis of thin film interfaces
H. Oechsner
Proc. IX IVC-V ICSS, Madrid (1983) 316-323

Vergleichende SNMS-,SIMS-,XPS- und AES-Analysen von Metallegierungen und nichtelementaren Halbleitern
K.-H. Müller, H. Oechsner, T. Halden
Fresenius Z. Anal. Chem. 314 (1983), 242-243

Ion Beam Induced Effects in Thin Film Analysis
H. Oechsner
Fresenius Z. Anal. Chem. 314 (1983), 211-214

Quantitative analysis of thin oxide and nitride layers on tantalum by sputtered neutral­mass spectrometry
H. Oechsner, A. Wucher
Thin Solid Films 90 (1982), 327-328

Auger Electron Spectroscopy Investigations of the Oxide Metal Interface between An­odic Ta2O5 Layers and Polycrystalline Tantalum
H. Oechsner and H. Schoof
Thin Solid Films 90 (1982), 337

Quantitative Analysis of Thin Oxide Layers of Tantalum by Sputtered Neutral Mass Spectrometry (SNMS)
H. Oechsner, A. Wucher
Appl. of Surface Sci. 10 (1982), 342-348

Molecule Formation in Oxide Sputtering
H. Oechsner
Springer Series in Chemical Physics 19 (1982), 106-114

Emission of Neutral Particles and Secondary Ions from Ion Bombarded Ta Covered with Oxygen and Nitrogen
E. Stumpe, H. Oechsner
Proc. IV Int. Conf. of Solid Surfaces and 3rd ECOSS, Cannes 1980, Vol. II, 1234-1237

Auger Analysis of the Ta2O5-Ta Interface
H. Schoof, H. Oechsner
Proc. IV Int. Conf. of Solid Surfaces and 3rd ECOSS, Cannes 1980, Vol. II, 1291-1294

Comparative Studies of Energy Distribution of Neutral Atoms Sputtered from a Ni W-Alloy and from Elemental Ni and W by 2.5 keV Ar+Ions
H. Oechsner and J. Bartella
Proc. 7th Intern. Conf. Atomic Coll. in Solids, Moscow State Publishing House 1980, Vol. II, p. 55-57

Matrix Effect Studies by Comparative SNMS and SIMS of Oxidized Ce, Cd and Ta Surfaces
H. Oechsner, W. Rühe, H. Schoof, E. Stumpe
Springer Ser. in Chemical Physics 9 (1980), 269-271